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Subgrain boundaries in Antarctic ice quantified by X-ray Laue diffraction

Published online by Cambridge University Press:  08 September 2017

Ilka Weikusat
Affiliation:
Alfred Wegener Institute for Polar and Marine Research, Columbusstrasse, D-27568 Bremerhaven, Germany E-mail: ilka.weikusat@awi.de
Atsushi Miyamoto
Affiliation:
Institute of Low Temperature Science, Hokkaido University, Sapporo 060-0819, Japan
Sérgio H. Faria
Affiliation:
GZG, Section of Crystallography, University of Göttingen, Goldschmidtstrasse 1, D-37077 Göttingen, Germany
Sepp Kipfstuhl
Affiliation:
Alfred Wegener Institute for Polar and Marine Research, Columbusstrasse, D-27568 Bremerhaven, Germany E-mail: ilka.weikusat@awi.de
Nobuhiko Azuma
Affiliation:
Department of Mechanical Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka 940-2188, Japan
Takeo Hondoh
Affiliation:
Institute of Low Temperature Science, Hokkaido University, Sapporo 060-0819, Japan
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Abstract

Ice in polar ice sheets undergoes deformation during its flow towards the coast. Deformation and recrystallization microstructures such as subgrain boundaries can be observed and recorded using high-resolution light microscopy of sublimation-edged sample surfaces (microstructure mapping). Subgrain boundaries observed by microstructure mapping reveal characteristic shapes and arrangements. As these arrangements are related to the basal plane orientation, full crystallographic orientation measurements are needed for further characterization and interpretation of the subgrain boundary types. X-ray Laue diffraction measurements validate the sensitivity of different boundary types with sublimation used by microstructure mapping for the classification. X-ray Laue diffraction provides misorientation values of all four crystal axes. Line scans across a subgrain boundary pre-located by microstructure mapping can determine the rotation axis and angle. Together with the orientation of the subgrain boundary this yields information on the dislocation types. Tilt and twist boundaries composed of dislocations lying in the basal plane, and tilt boundaries composed of nonbasal dislocations were found. A statistical analysis shows that nonbasal dislocations play a significant role in the formation of all subgrain boundaries.

Information

Type
Research Article
Copyright
Copyright © International Glaciological Society 2011
Figure 0

Fig. 1. Schematic description of subGB types described by Hamann and others (2007) and Weikusat and others (2009a,b). Modified after figure 7a in Weikusat and others (2009b). Note: as the crystal orientation data are taken as line scans (1-D track), the z-type subGB is classified either as normal or as parallel, depending on the very local subGB segment, where the X-ray Laue line scan crosses the subGB.

Figure 1

Fig. 2. Misorientation data across GBs (2365.8 m depth). (a) Microstructure mapping image with track of orientation measurements (white circles). Dark thick black lines: GBs. Thin lines: subGBs. GB grooves from the lower surface of the thin section are visible as unfocused lines, indicating inclination of GBs in three dimensions. (b) Misorientations between neighbouring points calculated from X-ray Laue measurements. (b) is placed according to (a), i.e. y = 0 mm is equal with lowest white circle in (a). Insert shows detail of (b) with different scale of misorientations axis. (c) Stereographic projection of c-axes (box symbols) and a-axes (circle symbols) to illustrate the general orientation of the centre grain. The basal plane is the great circle formed by the three a-axes.

Figure 2

Fig. 3. Misorientation data within a sublimation feature-free grain (454.8 m depth). (a–c) as in Figure 2. Misorientations among neighbouring points within the centre grain are less than 0.5°, the angular resolution.

Figure 3

Table 1. Frequencies of misorientations across shallow sublimation grooves (total number of subGBs measured: n ≈ 240)

Figure 4

Fig. 4. Rotation axes generating different configurations of misorientation. (a) Schematic of two crystals rotated around an arbitrary axis with respect to each other (left) and the two corresponding systems of crystal axes showing all misorientation angles (right). (b) Schematic of two crystals oriented to each other by rotation around the c-axis (left) and the two corresponding systems of crystal axes, with c being normal to the image plane, showing all misorientation angles (right). (c) Schematic of two crystals misoriented by rotation around one a-axis (left) and the two corresponding systems of crystal axes, with a1 being normal to the image plane, showing all misorientation angles (right). (d) Crystal axes with schematic crystal.

Figure 5

Fig. 5. Misorientation data across two subGBs highlighted in white (1855.9 m depth). (a–c) as in Figure 2. Left subGB has misorientation below the detection limit. Right subGB has no particularly low misorientation in the c- or one a-axis. (d) Misorientation with respect to the leftmost measurement point in a at x = 0 mm shows a gradient in misorientation and a significantly low value in one axis despite the arbitrary rotation axis close to the subGB.

Figure 6

Fig. 6. Misorientation data across several subGBs parallel to the basal plane trace (1855.9 m depth). (a–c) as in Figure 2. Multiple subGBs at x < 2 mm cannot be resolved due to the spatial resolution. The misorientation across subGB at x = 10 mm shows that the c-axis has a significantly lower value than the three a-axes. (d) Schematic illustration of the configuration of a rotation around the c-axis assuming a dislocation wall composed of screw dislocations lying in the basal plane. This configuration describes a twist boundary comprising two sets of screw dislocations in the basal plane with Burgers vectors b = a.

Figure 7

Fig. 7. Misorientation data of a subGB normal to the basal plane trace (655.9 m depth). (a–c) as in Figure 2. One a-axis has a significantly lower misorientation value than the other three axes across the subGB (x = 2.25 mm). (d) Schematic illustration of the configuration of a dislocation wall composed of edge dislocations perpendicular to the basal plane indicated by ‘T’ and the rotation axis, a1. This configuration describes a tilt boundary comprising edge dislocations in the basal plane with Burgers vector b=a.

Figure 8

Fig. 8. Misorientation data of a subGB parallel to the basal plane trace (1204.1 m depth). (a–c) as in Figure 2. One a-axis has a significantly lower value than the other three axes across the subGB (x = 1.75 mm). (d) Schematic illustration of the configuration of a dislocation wall composed of edge dislocations parallel to the basal plane indicated by ‘T’ and the rotation axis, a1. This configuration describes a tilt boundary comprising dislocations in a nonbasal plane with Burgers vector b = c or b = c0+ a.

Figure 9

Fig. 9. X-ray diffraction topographs (for method description see Higashi and others, 1988) from laboratory-grown ice single crystals. Grey-value contrasts indicate variations in dislocation density and in configuration of dislocations and in direction of the diffraction vector, g. Orientation of c-axes is identical in all five images (vertical). The direction of the diffraction vector g is given. (a) Stable walls of higher dislocation density normal to the basal plane (upper rim of plane indicated by dotted line and white arrows) and stable walls of higher dislocation density parallel to basal plane (black arrow indicates a strong example of many more horizontal dislocation walls). (b) Stable dislocation wall parallel to basal plane exhibited as a horizontal dark band indicated by arrows (diffraction vector is ). (c) X-ray topograph of the same crystal as (b), but with diffraction vector [0002]. The same dislocation wall indicated by the arrows in (b) displays a strong band here, which shows that this wall consists mainly of dislocations with the Burgers vector b = c. (d) Zigzag structure of regions of higher dislocation density. (e) Interacting walls parallel to basal (black arrows) and prismatic planes (white arrows).

Figure 10

Table 2. Absolute number frequencies of all subGBs with detectable misorientations (>0.5°; n = 165)