Hostname: page-component-77f85d65b8-45ctf Total loading time: 0 Render date: 2026-04-17T15:27:25.193Z Has data issue: false hasContentIssue false
  • English
  • Français

Interfacial Composition and Structure in Pt/Ni and Pt/Nb Multilayer Films

Published online by Cambridge University Press:  21 February 2011

J.A. Bain ,
B.M. Clemens  and
S. Brennan
J.A. Bain
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305–2205.
B.M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305–2205.
S. Brennan
Affiliation:
Stanford Synchrotron Radiation Lab, Stanford University, Stanford, CA 94305.
Get access

Abstract

The interfacial structure of Pt/Nb and Pt/Ni sputtered multilayer films was studied using x-ray diffraction in symmetric, asymmetric, and grazing incidence modes. The grazing incidence and asymmetric diffraction were used to distinguish alloying effects on the lattice spacing from strain in the films. This strain was shown to be consistent with semi-coherent interfaces in the Pt/Ni but not in the Pt/Nb in which another strain generating mechanism dominates.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 187: Symposium J – Thin Film Structures and Phase Stability , 1990 , 315
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Clemens, B.M. and Eesley, G.L., Phys. Rev. Lett. 61 (20) (1988) p.2356.Google Scholar
2. Cammarata, R.C. and Sieradzki, K., Phys. Rev. Lett. 62 (17) (1989) p.2005.Google Scholar
3. Matthews, J.W., ”Coherent Interfaces and Misfit Dislocations” in Epitaxial Growth, Ed. Matthews, J.W., Academic Press, N.Y., p. 559, (1975).Google Scholar
4. Flinn, P.A. and Waychunas, G.A., J. Vac Sci. and Tech. B 6 (6) (1988) p. 1749 Google Scholar
5. Brennan, S. inX-rays in Materials Analysis: Novel Applications and Recent Developments (SPIE Proc. 690, San Diego, CA 1986) p. 124 Google Scholar
6. Flinn, P.A. and Chiang, C., J. Appl Phys, preprint, (1989).Google Scholar
7. Cullity, B.D., Elements of X-ray Diffraction, Addison-Wesley Inc., Reading, MA, pp. 454–460.Google Scholar
8. Nix, W.D, Course Notes: MSE 207B, Dept. of Mat. Sci., Stanford University, Stanford, CA, 167–177, 1990 (unpublished).Google Scholar
9. Lamble, G.M., Heald, S.M., and B.M. Clemens in Mater. Res. Soc. Proc. (Fall 1989 Meeting)Google Scholar
10. Hansen, M. and Anderko, K., Constitution of Binary Alloys, (McGraw-Hill Book Co., New York, 1958), p.1031–1032.Google Scholar
11. Baker, S. P. and Nix, W.D. in Thin Films: Stresses and Mechanical Properties II edited by Oliver, W., Doerner, M., Pharr, G. and Brotzen, F. R. (Mater. Res. Soc. Proc. 188, Pittsburgh, PA, 1990) (to be published)Google Scholar