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Determining the stoichiometric composition of Wyoming montmorillonite using improved transmission electron microscopy-energy dispersive X-ray (TEM-EDX) techniques

Published online by Cambridge University Press:  20 November 2024

L.N. Warr*
Affiliation:
Institute of Geography and Geology, University of Greifswald, D-17487 Greifswald, Germany
B.R. Thombare
Affiliation:
Institute of Geography and Geology, University of Greifswald, D-17487 Greifswald, Germany
R. Sudheer Kumar
Affiliation:
Institute of Geography and Geology, University of Greifswald, D-17487 Greifswald, Germany
M. Peltz
Affiliation:
Institute of Geography and Geology, University of Greifswald, D-17487 Greifswald, Germany
C. Podlech
Affiliation:
Institute of Geography and Geology, University of Greifswald, D-17487 Greifswald, Germany
G.H. Grathoff
Affiliation:
Institute of Geography and Geology, University of Greifswald, D-17487 Greifswald, Germany
*
Corresponding author: L.N. Warr; Email: warr@uni-greifswald.de
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Abstract

Transmission electron microscopy-energy dispersive X-ray analysis (TEM-EDX) represents an effective tool for determining the stoichiometric composition of clay minerals, but the methodology is often hampered by analytical difficulties. Studies of beam-sensitive minerals, such as smectites, are associated with low count intensities and dynamic loss of cations (e.g. K+, Na+, and Al3+), which can lead to erroneous quantifications of composition. After exploring how to minimize cation migration by reducing the beam current density to <5 pA cm–2, the most reliable and consistent compositions were determined using 1 μm2 area measurements of particles acquired in normal TEM mode where the electron beam was parallel, the degree of specimen damage was at its minimum and good acquisition intensities (>10,000 cps) were acquired. Based on 528 TEM-EDX area analyses, the composition of Wyoming montmorillonites (SWy-1, SWy-2, and SWy-3) was studied in their natural and Ca-saturated states from thin (<50 nm thick) particle aggregates lying on lacey carbon films. Overall, the TEM-EDX results confirmed the heterogeneous charge distributions of montmorillonite at the particle and sample levels. The average composition per formula unit of SWy-1 to -3 was determined as: (Na0.12Ca0.04Mg0.03K0.02)(Si3.91Al0.09)(Al1.57Mg0.27Fe0.19)2.03 O10(OH)2 · nH2O, where the tetrahedral and octahedral layer charges are –0.09 and –0.19 per O10(OH)2, respectively, and the total layer charge ranges from –0.25 to –0.30 per O10(OH)2 (mean of –0.28). This study demonstrates how TEM-EDX can provide new insight into the natural heterogeneities of smectite chemistry as long as adequate calibration and specimen damage control procedures are implemented.

Information

Type
Original Paper
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2024. Published by Cambridge University Press on behalf of The Clay Minerals Society
Figure 0

Table 1. Mean chemical compositions of the various grain-size fractions of the SWy-series (SWy-1, SWy-2, SWy-3) normalized to 100% and without hydroxyls and water

Figure 1

Figure 1. Ternary plot of SiO2vs CaO+Na2O+K2O vs Al2O3+Fe2O3+MgO (normalized to 100%) for the different grain-size fractions of the SWy-1, SWy-2, and SWy-3 sample series. Calculated from the oxide weight % data listed in Table 1. The montmorillonite compositions determined in this study are shown as open symbols.

Figure 2

Figure 2. (a) Rietveld refinement of the X-ray diffraction pattern of a random powder preparation of the SWy-3 <1 μm fraction (after Ca-saturation) containing montmorillonite, quartz, cristobalite, and calcite. The patterns were measured using a Bruker D8 Advance diffractometer (Karlsruhe, Germany) with CoKα radiation, a Lynxeye 1D stripe detector, and primary and secondary Soller collimators. The refinement was made using Profex (Doebelin and Kleeberg, 2015). Successful quantification of the mixed water-layered structures of the dried montmorillonite required a combination of smectite and R0 illite-smectite parameter files used by Ufer et al. (2012). (b) Comparative X-ray diffraction patterns of textured preparations of the SWy1-3 series <1 μm fractions with natural cation contents after ethylene glycol treatment. Samples contain mostly montmorillonite (Mnt) with trace concentrations of muscovite (Mus), quartz (Qz), ±cristobalite (Crs) and ±calcite (Cal). IMA-approved mineral abbreviations after Warr (2020).

Figure 3

Figure 3. TEM-EDX-determined elemental concentrations (expressed as oxide wt.) vs count time (s) for selective montmorillonite particles based on (a) spot analysis in TEM mode, (b) area analysis in TEM mode, (c) higher-resolution area analysis using the mapping option in TEM mode, (d) spot analysis in STEM mode, (e) area analysis in STEM mode, and (f) mapping analysis in STEM mode. All measurements were made at 50,000× magnification using the setting listed in Table S1 (see Supplementary material). For point and area TEM mode analyses, the count rates obtained using a time constant of 4 or 6 ranged between 10,000 and 20,000 cps with dead times of 2–3%. For STEM mode analyses using a time constant of 4, the count rates ranged between 2000 and 5000 cps with deadtimes of 1–3%. The disappearance of K2O after ~30 s in panel (c) was due to the inability of the software to detect this elemental peak below certain detection limits.

Figure 4

Figure 4. TEM-EDX determined elemental concentrations (expressed as oxide wt.%) vs count time (s) for a selected montmorillonite particle measured in TEM mode by area analysis. The decreasing concentrations of many elements with time indicate specimen damage and migration out of the electron beam. Measurement parameters were 100,000×, count input ~10,000 cps, deadtime 2–3% and a time constant of 4.

Figure 5

Figure 5. TEM-EDX particle measurements vs XRF bulk powder measurements of the elements contained in the 12 pure minerals used for calibration purposes (data provided in Table S2 in the Supplementary material). Elemental concentration expressed as oxide wt.%.

Figure 6

Table 2. Mean chemical compositions of the <1 μm size fractions of the SWy-series (SWy-1, SWy-2, SWy-3) measured in our laboratory by TEM-EDX, SEM-EDX, and XRF

Figure 7

Table 3. Reported stoichiometric formula (per O10(OH)2) for montmorillonites of the SWy sample series

Figure 8

Table 4. Stoichiometric formula (per O10(OH)2) for montmorillonites of the SWy sample series determined in this study

Figure 9

Figure 6. (a) TEM images of stacked montmorillonite particles with some occasional lath-shaped crystals (SWy-1 natural). (b) Selected area electron diffraction of stacked montmorillonite particles. Mnt = montmorillonite. d-values and Miller indices of the marked diffraction rings are 4.5 Å (020) (110), 2.6 Å (130) (200), and 1.5 Å (060) (330).

Figure 10

Figure 7. TEM images of montmorillonite particles (SWy-3 natural). (a) ~1 μm2 aggregate of particles used for TEM-EDX measurements located over a hole in the lacey carbon film. The smaller hexagonal particles represent small <100 nm crystallites of montmorillonite (bottom right, inset). (b) Lattice fringes of particles stacked with (001) basal spacings of ~1.2 nm located around a flat sub-spherical montmorillonite with (020) cross fringes of 0.45 nm. (c) High-resolution lattice fringe images of (001) basal spacing with thicknesses of ~1.2 nm. The white lines mark the thickness of crystallites that are separated by layer terminations and low-angle discontinuities. (d) High-resolution image of the (001) basal spacing with an inset improved by inverse fast Fourier transformation to show the location of the tetrahedral (T), octahedral (O), and interlayer sheets.

Figure 11

Figure 8. (a) TEM image of nanosized α-cristobalite (Crs) crystals (SWy-3 natural). Prominent lattice fringes occur with a thickness of 0.40 nm (101). A fast Fourier transformation (FFT) of the bottom right grain reveals the tetragonal symmetry of the α-cristobalite (bottom left) as does the inverse FFT (top right). (b) An irregular cristobalite grain showing a characteristic high contrast and twin sets marked by bands at 60° to each other. Prominent lattice fringes occur with a thickness of 0.40 nm (101). The arrows in the FFT insets indicate some diffuse ring structure suggestive of some minor crystal disorder.

Figure 12

Figure 9. Montmorillonite crystallite thickness distributions for reference materials: (a) SWy-1, (b) SWy-2, and (c) SWy-3. The mean values are marked with arrows, which are 7.2 nm for SWy-1 (n=1284), 7.0 nm for SWy-2 (n=1232), and 7.3 nm for SWy-3 (n=1164).

Figure 13

Figure 10. Montmorillonite layer charge distributions for (a) SWy-1, (b) SWy-2, and (c) SWy-3. TC = tetrahedral charge; OC = octahedral charge; TLC = total layer charge.

Figure 14

Figure 11. Number of cations per formula unit (per O10(OH)2) vs charge properties of the Wyoming montmorillonite. (a) Tetrahedral cations (Si4+ and Al3+) vs tetrahedral charge, which are mathematically fixed to four cations; (b) octahedral cations (Al3+, Mg2+, Fe3+) vs octahedral charge; (c) interlayer cations (Na+, Ca2+, Mg2+, K+) vs total layer charge. Symbols: circles = SWy-1, triangles = SWy-2, and squares = SWy-3. Color code for elements as in Fig.5.

Figure 15

Figure 12. Comparison of the montmorillonite total layer charge (TLC) distributions for the <1 μm fraction of SWy-2 determined by TEM-EDX composition analyses (blue line) and the bulk powder fraction determined by the alkylammonium method of Lagaly (1972). The latter is shown in the form of a histogram plotted from the results of Hofmann (2003).

Figure 16

Figure 13. Triangle muscovite (Ms)–celadonite (Cel)–pyrophyllite (Prl) plot showing the mean charge properties (tetrahedral, octahedral, and total layer) of montmorillonite in the SWy-sample series (SWy-1, SWy-2, SWy-3). Plot modified from Newman and Brown (1987). IMA-approved mineral abbreviations after Warr (2020). The unit of layer charge is per O10(OH)2.

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