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Application of micro-X-ray fluorescence to chemical mapping of polar ice

Published online by Cambridge University Press:  08 September 2017

M.C. Morel Fourcade
Affiliation:
Laboratoire de Glaciologie at Géophysique de I’Environnement (CNRS-UJF), 54 rue Molière, BP 96, 38402 Saint-Martin-d’Heres Cedex, France E-mail: fourcade@lgge.obs.ujf-grenoble.fr
J.M. Barnola
Affiliation:
Laboratoire de Glaciologie at Géophysique de I’Environnement (CNRS-UJF), 54 rue Molière, BP 96, 38402 Saint-Martin-d’Heres Cedex, France E-mail: fourcade@lgge.obs.ujf-grenoble.fr
J. Susini
Affiliation:
European Synchrotron Radiation Facility, 6 rue Jules Horowitz, BP 220, 38043 Grenoble Cedex, France
R. Baker
Affiliation:
European Synchrotron Radiation Facility, 6 rue Jules Horowitz, BP 220, 38043 Grenoble Cedex, France
G. Durand
Affiliation:
Laboratoire de Glaciologie at Géophysique de I’Environnement (CNRS-UJF), 54 rue Molière, BP 96, 38402 Saint-Martin-d’Heres Cedex, France E-mail: fourcade@lgge.obs.ujf-grenoble.fr
M. de Angelis
Affiliation:
Laboratoire de Glaciologie at Géophysique de I’Environnement (CNRS-UJF), 54 rue Molière, BP 96, 38402 Saint-Martin-d’Heres Cedex, France E-mail: fourcade@lgge.obs.ujf-grenoble.fr
P. Duval
Affiliation:
Laboratoire de Glaciologie at Géophysique de I’Environnement (CNRS-UJF), 54 rue Molière, BP 96, 38402 Saint-Martin-d’Heres Cedex, France E-mail: fourcade@lgge.obs.ujf-grenoble.fr
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Abstract

Synchrotron-based micro-X-ray fluorescence (μXRF) equipment has been used to analyze impurities in polar ice. A customized sample holder has been developed and the μXRF equipment has been adapted with a thermal control system to keep samples unaltered during analyses. Artificial ice samples prepared from ultra-pure water were analyzed to investigate possible contamination and/or experimental artefacts. Analyses of polar ice from Antarctica (Dome C and Vostok) confirm this μXRF technique is non-destructive and sensitive. Experiments can be reproduced to confirm or refine results by focusing on interesting spots such as crystal grain boundaries or specific inclusions. Integration times and resolution can be adjusted to optimize sensitivity. Investigation of unstable particles is possible due to the short analysis time. In addition to identification of elements in impurities, μXRF is able to determine their speciations. The accuracy and reliability of the results confirm the potential of this technique for research in glaciology.

Information

Type
Instruments and Methods
Copyright
Copyright © International Glaciological Society 2005
Figure 0

Fig. 1. (a) Internal part of the analysis chamber; a: Dewar flask; b: copper cylinder; c: copper tress; d: thermocouple; e: support of piezometer electric scanner. (b) The sample cell and its support; a: the front window; b: the sample cell support; c: Peek®; d: screw; e: magnets. (c) Details of the sample cell.

Figure 1

Table 1. Concentrations (ngg 1) measured by ion chromatography for artificial sample (S1), Dome C (DC1) and Vostok samples (V1, V2)

Figure 2

Fig. 2. μXRF spectra from the sample cell filled with air and from the artificial sample (S1). The spectrum from the sample cell filled with air is characterized by a high peak from argon. This result shows the presence of air in the sample cell.

Figure 3

Table 2. μXRF results from test samples (artificial ice (S1) and sample cell filled with air)

Figure 4

Fig. 3. (a) μXRF spectra (only Si Ka line shown) from an inclusion observed in sample V2 (Vostok at 3572 m) for different radiation exposure times (2.5, 5 and 7.5 hours). (b) Relative-intensity profiles of the Si Ka line along the cross-section of the inclusion. The absence of significant variations confirms the preservation of the sample, even after long exposure times.

Figure 5

Table 3. Evolution of Cl relative intensity in an aggregate for different integration times

Figure 6

Fig. 4. Map of fluorescence yield of potassium (DC1 sample). Pixel size 2.6 × 2.6μm2 integration time 3.3 s. Z1 scan refers to the A particle, Z2 to B, Z3 to C. K is clearly found along the grain boundaries (the Y shape on the right of the map).

Figure 7

Fig. 5. Relative intensity profiles (Ca, K, S, Si, Al Ka line) along cross-sections Z1, Z2 and Z3 (see Fig. 4; gb indicates the grain boundary). Si and Al are highly concentrated on two specific points (A and B). Si and Al could be within clay particles and associated with Ca (A, B). S is associated with Ca in one highly concentrated spot (A).

Figure 8

Fig. 6. (a) Aggregate observed on the V1 sample (Vostok at 3551 m). The lighter regions (visible at the periphery) may be gas bubbles, while the dark regions look like the solid part of the aggregate. The rectangular region indicated was analyzed by μXRF. (b) Results of the analysis: maps of Ca and K distributed on the aggregate (image size 300 × 100 μm2; pixel size: 1 × 1 μm2; integration time 0.5 s). Ca is distributed as large particles. Their shapes and compositions are different inside (circles) and outside (dashed circle) the aggregate. Ca seems anticorrelated with K (white circles). (c) μXRF spectra from the upper particles inside and outside the aggregate (circled in (b)).

Figure 9

Table 4. Relative intensities for various elements measured in natural samples

Figure 10

Fig. 7. (a) Map of S (oxidized form) on the inclusion observed in sample V2 (Vostok at 3572 m) using 2.482 keV, image size 50 × 40 μm2, pixel size 0.5 × 0.5 μm2, integration time 0.5 s. (The dashed line indicates the cross-section analyzed in (c).) (b) Map of S (reduced form) on the inclusion observed in sample V2 using 2.473 keV, image size 50 × 40 μm2, pixel size: 0.5 × 0.5 μm2, integration time 0.5 s. (The dashed line indicates the cross-section analyzed in (c).) (c) Relative intensity profiles from the oxidized and reduced forms of sulphur along the cross-section.