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Measuring specific surface area of snow by near-infrared photography

Published online by Cambridge University Press:  08 September 2017

Margret Matzl
Affiliation:
WSL Swiss Federal Institute for Snow and Avalanche Research, Flü elastrasse 11, CH-7260 Davos Dorf, Switzerland E-mall: schneebeli@slf.ch
Martin Schneebeli
Affiliation:
WSL Swiss Federal Institute for Snow and Avalanche Research, Flü elastrasse 11, CH-7260 Davos Dorf, Switzerland E-mall: schneebeli@slf.ch
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Abstract

The specific surface area (SSA) is considered an essential microstructural parameter for the characterization of snow. Photography in the near-infrared (NIR) spectrum is sensitive to the SSA. We calculated the snow reflectance from calibrated NIR images of snow-pit walls and measured the SSA of samples obtained at the same locations. This new method is used to map the snow stratigraphy. The correlation between reflectance and SSA was found to be 90%. Calibrated NIR photography allows quantitative determination of SSA and its spatial variation in a snow profile in two dimensions within an uncertainty of 15%. In an image covering 0.5–1.0 m2, even layers of 1mm thickness can be documented and measured. Spatial maps of SSA are an important tool in initializing and validating physical and chemical models of the snowpack.

Information

Type
Research Article
Copyright
Copyright © International Glaciological Society 2006
Figure 0

Fig. 1. (a) NIR image of a snow-pit wall with four calibration targets (i) in the corners. The locations of the sample containers are marked with a black frame. (b) Magnification of the NIR image at one sample location. The vertical distribution of the reflectance signal for this sample is calculated based on the pixel intensity of the targets (i). (c) Image covering the same snow-pit wall with the inserted sample containers (ii). The surface section of one sample is displayed (d) and also the corresponding measured specific surface area (SSA) values.

Figure 1

Fig. 2. Surface section and NIR image of two snow samples and the derived density, specific surface area (SSA) and reflectance signals. For sample 2 the absolute height of the surface section and the NIR image vary. The grey bands mark visually identified layers.

Figure 2

Fig. 3. Scatter plot of measured specific surface area (SSA) values vs reflectance with a fit (solid line; Equation (3)). The dotted line indicates the relationship between reflectance at 890 nm and SSA based on published values by Wiscombe and Warren (1980), Dozier (1992), and Sergent and others (1993).

Figure 3

Fig. 4. Scatter plot of SSA and density.

Figure 4

Fig. 5. SSA mapped for a snow-pit wall combined with a traditional hand profile. Larger boundaries are marked with a dotted line.

Figure 5

Fig. 6. SSA mapped for a snow pit with inhomogeneous illumination.