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Roles of Surface Termination in Photoluminescence Mechanisms of Porous Si

Published online by Cambridge University Press:  15 February 2011

Y. Suda
Affiliation:
Faculty of Technology, Tokyo University of Agriculture and Technology, 2–24–16 Naka-cho, Koganei, Tokyo 184, Japan, sudayos@cc.tuat.ac.jp
K. Obata
Affiliation:
Faculty of Technology, Tokyo University of Agriculture and Technology, 2–24–16 Naka-cho, Koganei, Tokyo 184, Japan, sudayos@cc.tuat.ac.jp
A. Kumagai
Affiliation:
Faculty of Technology, Tokyo University of Agriculture and Technology, 2–24–16 Naka-cho, Koganei, Tokyo 184, Japan, sudayos@cc.tuat.ac.jp
N. Koshida
Affiliation:
Faculty of Technology, Tokyo University of Agriculture and Technology, 2–24–16 Naka-cho, Koganei, Tokyo 184, Japan, sudayos@cc.tuat.ac.jp
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Abstract

The relationship between the oxidation states and PL properties and the effects of H/O termination exchange on the PL properties of PS have been investigated using synchrotron radiation photoemission spectroscopy (SR-PES), Auger electron spectroscopy (AES), Fourier transform infrared (FTIR), and photoluminescence (PL) techniques. The energy band gap, the peak energy and FWHM of the PL spectrum are almost unchanged by the oxidation process and by the H/O termination exchange. After the oxidation, the PL peak intensity decreased, suggesting the creation of nonradiative centers. In the H/O termination exchange experiment, the PL peak intensity decreased by more than 65% upon annealing. However, it recovered the initial PL intensity by oxygen exposure. These results suggest that the surface termination itself functions to eliminate the nonradiative centers without depending on the termination species of hydrogen or oxygen, and that the skeletal structure of PS crystallites is important in the PL mechanisms.

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Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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