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Measurement of vertical profiles of snow specific surface area with a 1 cm resolution using infrared reflectance: instrument description and validation

Published online by Cambridge University Press:  08 September 2017

L. Arnaud
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
G. Picard
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
N. Champollion
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
F. Domine
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
J.C. Gallet
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
E. Lefebvre
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
M. Fily
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
J.M. Barnola
Affiliation:
Laboratoire de Glaciologie et Géophysique de l’Environnement, CNRS/Université Joseph Fourier – Grenoble I, 54 rue Molière, BP 96, 38402 Saint-Martin-d’Hères Cedex, France E-mail: laurent.arnaud@lgge.obs.ujf-grenoble.fr
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Abstract

The specific surface area (SSA), defined as the surface area of ice per unit mass, is an important variable characterizing the complex microstructure of snow. Its application range covers the physical evolution of snow (metamorphism), photochemistry and optical and microwave remote sensing. This paper presents a new device, POSSSUM (Profiler Of Snow Specific Surface area Using SWIR reflectance Measurement), designed to allow the rapid acquisition of SSA profiles down to ∼20 m depth and with an effective vertical resolution of 10–20 mm. POSSSUM is based on the infrared (IR) reflectance technique: A laser diode operating at 1310 nm illuminates the snow at nadir incidence angle along the face of a drilled hole. The reflected radiance is measured at three zenith angles (20°, 40° and 60°) each for two azimuth angles (0° and 180°). A second laser operating at a shorter wavelength (635 nm), which is almost insensitive to SSA, allows the distance to the snow face to be estimated. The reflected IR radiance and the distance are combined to estimate bidirectional reflectances. These reflectances are converted into hemispherical reflectances and in turn into SSA using a theoretical formulation based on an asymptotic solution of the radiative transfer equation. The evaluation and validation of POSSSUM’s SSA measurements took place in spring 2009 in the French Alps. The new method was compared with the methane adsorption technique and DUFISSS, another well-validated instrument based on the IR technique. The overall measurement error is in the range 10–15%.

Information

Type
Instruments and Methods
Copyright
Copyright © International Glaciological Society 2011
Figure 0

Fig. 1. (a) Experimental set-up in the field with POSSSUM, the snow drill device, the tripod with a manual winch and a depth system measurement, the data acquisition system and the power supply. (b) Picture of POSSSUM which is composed of a bore with a guiding system (A), an optical measurement part with laser diodes and photodiodes (B), an electronic part for laser drivers and photodiode amplifiers (C) and anti-torque system (D).

Figure 1

Fig. 2. Schematic view of the optical system of POSSSUM showing the relative positions of illumination source (laser) and reflectance measurements (photodiodes): (a) side view; (b) front view, in the axis of the illuminating beam.

Figure 2

Fig. 3. Measured signal of the +20° photodiode for five different calibration panels. The reflectance of the calibration panels is the hemispherical reflectance at 1310 nm. The trend is the least-square linear regression.

Figure 3

Table 1. Calibration factor for reflectance calculation and reproducibility of each photodiode calculated with 42 different calibration experiments performed both in the laboratory and in the field

Figure 4

Fig. 4. Effect of the distance between the point of convergence of the photodiodes and the reflecting surface (Spectralon 50%) on the measured signal for the 20° (a), 40° (b) and 60° (c) photodiodes (circles). The horizontal displacement was varied from −12 mm to +12 mm relative to the ideal distance. Signals calculated (solid curves) with Equations (8–11) are compared to the experimental data.

Figure 5

Fig. 5. Two geometrical configurations of POSSSUM’s optical head in the hole and parameters used in the calculation of the power received by the photodiode as a function of the distance dy. (a) dy = 0 ideal position (i.e. no correction needed) and (b) dy ≠ 0 position implying a distance correction.

Figure 6

Fig. 6. Variations of versus at two different viewing zenith angles, θ0 (20° and 40°), calculated using the geometrical model for variations of dy in the range ±13 mm.

Figure 7

Fig. 7. Effect of the distance correction on the reflectance at two different viewing zenith angles: (a) 20° and (b) 40°. Dashed curves are snow reflectances during the pendulum experiment, and red solid curves are the distance-corrected signals. (c) Amplitude of the oscillations of POSSSUM dy calculated with the reflectance measured at 635 nm and Equation (12).

Figure 8

Fig. 8. Comparison of hemispherical reflectances obtained in the laboratory using snow samples with POSSSUM and DUFISSS (circles). R2 is computed with the residual sum of squares errors between the real data points and the y = x model.

Figure 9

Fig. 9. Profiles of hemispherical reflectance measured with POSSSUM (solid line) and discontinuous measurements with DUFISSS (circles) obtained on Glacier de la Girose on 17 April 2009.

Figure 10

Fig. 10. Comparison of hemispherical reflectances obtained with POSSSUM and DUFISSS. Squares are field measurements, and circles are laboratory measurements. R2 is computed with the residual sum of squares errors between the real data points and the y = x model.

Figure 11

Fig. 11. SSA calculated with the processing algorithm from the reflectance measured with POSSSUM versus SSA measured using CH4 adsorption at 77 K. R2 is computed with the residual sum of squares errors between the real data points and the y = x model.

Figure 12

Fig. 12. Profiles of SSA obtained with POSSSSUM on Glacier de la Girose on 17 April 2009 without (a) and with (b) distance correction during the descent (solid curves) and the ascent (blue dashed curves). To quantify the distance correction during descent and ascent, the distance dy calculated with Equations (12–16) is plotted (c). Some SSA measurements using methane adsorption on sampled snow (red circles) are also shown for direct comparison.