Hostname: page-component-8448b6f56d-wq2xx Total loading time: 0 Render date: 2024-04-23T19:26:29.374Z Has data issue: false hasContentIssue false
  • English
  • Français

Dielectric and Optical Properties of Perovskite-type Artificial Superlattices

Published online by Cambridge University Press:  01 February 2011

Takakiyo Harigai ,
Song-Min Nam ,
Hirofumi Kakemoto ,
Satoshi Wada ,
Keisuke Saito  and
Takaaki Tsurumi
Takakiyo Harigai
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2–12–1 Ookayama, Meguro-ku, Tokyo 152–8552, Japan
Song-Min Nam
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2–12–1 Ookayama, Meguro-ku, Tokyo 152–8552, Japan
Hirofumi Kakemoto
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2–12–1 Ookayama, Meguro-ku, Tokyo 152–8552, Japan
Satoshi Wada
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2–12–1 Ookayama, Meguro-ku, Tokyo 152–8552, Japan
Keisuke Saito
Affiliation:
BRUKER AXS K. K., 3–9-A Moriya-cho, Kanagawa-ku, Yokohama-shi, Kanagawa 221–0022, Japan
Takaaki Tsurumi
Affiliation:
Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2–12–1 Ookayama, Meguro-ku, Tokyo 152–8552, Japan
Get access

Abstract

BaTiO3/SrTiO3, BaTiO3/BaZrO3, and SrZrO3/SrTiO3 artificial superlattices were fabricated on SrTiO3 substrates by the molecular beam epitaxy (MBE) process. The stacking periodicity of each layer was varied from 1 unit cell to 40 unit cells, and the total thickness was fixed at 80 unit cells. In-situ reflection high-energy electron diffraction (RHEED) and x-ray diffraction (XRD) clearly shows the formation of the superlattice structure. Their lattice parameters obtained from the reciprocal space mapping measurement indicated that the lattice distortion was dependent on the stacking periodicity. The capacitance and the complex admittance of the superlattices were measured with interdigital electrodes by an impedance analyzer up to 110 MHz. It was found that the dielectric permittivity changed with the superlattice periodicity. The Q-V measurement results showed clear hysteresis curves and this suggested that ferroelectricity was induced into the SrZrO3/SrTiO3 superlattices despite a combination between paraelectrics/paraelectrics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 833: Symposium G – Materials, Integration, and Packaging Issues for High-Frequency Devices II , 2004 , G5.3
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Iijima, K., Terashima, T., Bando, Y., Kamigai, K., and Terauchi, H., J. Appl. Phys. 72, 2840 (1992).Google Scholar
2. Tsurumi, T., Suzuki, T., Yamane, M., and Daimon, M., Jpn. J. Appl. Phys., Part 1 33, 5192 (1994).Google Scholar
3. Tsurumi, T., Miyasou, T., Ishibashi, Y., and Ohashi, N., Jpn. J. Appl. Phys., Part 1 37, 5104 (1998).Google Scholar
4. Tabata, H., Tanaka, H., and Kawai, T., Appl. Phys. Lett. 65, 1970 (1994).Google Scholar
5. Tsurumi, T., Ichikawa, T., Harigai, T., Kakemoto, H., and Wada, S., J. Appl. Phys. 91, 2284 (2002).Google Scholar
6. Harigai, T., Tanaka, D., Kakemoto, H., Wada, S., and Tsurumi, T., J. Appl. Phys. 94, 7923 (2003)Google Scholar
7. Farnell, G., Cermak, I., Silver, P., and Wong, S., IEEE Trans. on Sonics and Ultrasonics, SU-17, 188–95(1970).Google Scholar
8. Abe, K., Komatsu, S., Yanase, N., Sano, K. and Kawakubo, T., Jpn. J. Appl. Phys. 36, 5575 (1997).Google Scholar
9. Abe, K., Yanase, N., Komatsu, S., Sano, K. and Kawakubo, T., Oyo Buturi 67, 1286 (1998) [in Japanese].Google Scholar
10. Kawakubo, T., Komatsu, S., Abe, K., Sano, K., Yanase, N. and Fukushima, N., Jpn. J. Appl. Phys. 37, 5108 (1998)Google Scholar