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Amorphization of PLZT Material by 1.5 MeV Krypton Ion Irradiation with In Situ TEM Observation

Published online by Cambridge University Press:  25 February 2011

L.M. Wang ,
A.Y. Wu  and
R.C. Ewing
L.M. Wang
Affiliation:
Department of Geology, University of New Mexico, Albuquerque, NM 87131
A.Y. Wu
Affiliation:
Center for High Technology Materials, University of New Mexico, Albuquerque, NM 87131
R.C. Ewing
Affiliation:
Department of Geology, University of New Mexico, Albuquerque, NM 87131
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Abstract

PLZT 9/65/35 single crystals were irradiated with 1.5 MeV krypton ions at 25–450°C in the HVEM-Tandem Facility at Argonne National Laboratory. In-situ TEM was performed during irradiation in order to determine the critical amorphization dose. At room temperature, the material was completely amorphized after a dose of only 1.9×1014 ions/cm2, less than one fifth of the critical amorphization dose for silicon (1×1015 ions/cm2). The critical amorphization dose for the PLZT material increased with increasing irradiation temperature. At 450°C, amorphization was not observed after a dose of 1.1×10 15ions/cm2.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 268: Symposium K – Materials Modification by Energetic Atoms and Ions , 1992 , 343
Copyright
Copyright © Materials Research Society 1992

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References

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