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Mechanism for Radiative Recombination in In0.15Ga0.85N/GaN Multiple Quantum Well Structures

Published online by Cambridge University Press:  13 June 2014

B Monemar
Affiliation:
Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden
J P Bergman
Affiliation:
Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden
J Dalfors
Affiliation:
Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden
G Pozina
Affiliation:
Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden
B E Sernelius
Affiliation:
Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden
P O Holtz
Affiliation:
Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden
H Amano
Affiliation:
Department of Electrical Engineering and Electronics, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468, Japan
I Akasaki
Affiliation:
Department of Electrical Engineering and Electronics, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468, Japan

Abstract

We present a study of the radiative recombination in In0.15Ga0.85N/GaN multiple quantum well samples, where the conditions of growth of the InGaN quantum layers were varied. The piezoelectric field as well as short range potential fluctuations are screened via different mechanisms by donor electrons and excited electron-hole pairs. These effects account for a large part of the spectral shift with donor doping (an upward shift of the photoluminescence (PL) peak up to 0.2 eV is observed for a Si donor density of 2 × 1018 cm−3 in the well), with excitation intensity and with delay time after pulsed excitation (also shifts up to 0.2 eV). It appears like 2-dimensional screening of short range potential fluctuations is needed to fully explain the data. We suggest that excitons as well as shallow donors are at least partly impact ionized by electrons in the rather strong lateral potential fluctuations.

Information

Type
Research Article
Copyright
Copyright © 1999 Materials Research Society
Figure 0

Fig. 1. Timeresolved PL spectra, with 0.8 ns between each spectrum, for two MQW samples obtained at 2 K with excitation at 3.6 eV. In a) are shown the spectra for a undoped sample while b) shows the corresponding data for a doped sample. Note the strong spectral shift between the two samples.

Figure 1

Fig. 2. Timeresolved PL spectra for an MQW sample with the InGaN layer grown at 750 C, obtained at 2 K (a) and at 300 K (b), respectively. The spectra at 300 K are broadened towards higher energy, and also have shorter decay time.

Figure 2

Fig. 3. Effective decay times as a function of detection photon energy for an undoped sample with the InGaN growth temperature 780°C.

Figure 3

Fig. 4 (a). The general behavior of the static 2D dielectric function. Each curve is for a different carrier concentration. The dotted, dash-dotted, dashed and solid curves are for progressively higher carrier concentrations. All curves coincide for small momentum. Fig. 4 (b). The screening effect on a Gaussian potential of width 100 Å in one of the quantum wells. The dotted curve is the bare potential. The dash-dotted, dashed, full and dash-triple-dotted curves are for the carrier concentrations 2×1017 cm−3, 4×1017 cm−3, 2×1018 cm−3 and 1×1019 cm−3, respectively. All curves have been scaled to the value at the center of the unscreened potential.