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Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon δ-Doped Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 589 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 173
- Print publication:
- 1999
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Unimportance of Siloxene in Luminescent Porous Silicon as Determined by Nexafs & Exafs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 295
- Print publication:
- 1993
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