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1 results

  • Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

  • S. Lorbek, G. Hlawacek, C. Teichert
  • Journal:
    The European Physical Journal - Applied Physics / Volume 55 / Issue 2 / August 2011
    Published online by Cambridge University Press:
    11 August 2011, 23902
    Print publication:
    August 2011
    • Article
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  • One of the important parameters in understanding the mechanism of the early stage of organic thin-film growth is the critical nucleus size i*. Here, submonolayer films of para-sexiphenyl grown on amorphous silicon dioxide substrates were investigated by means of atomic-force microscopy and have been analyzed using the recently proposed capture-zone scaling. Applying the generalized Wigner surmise we determine from the capture-zone distribution i* at room temperature and 373 K. The results are compared to traditional analysis by island-size scaling and the applicability of the capture-zone scaling is critically discussed with respect to island shape.