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Scanning-Ion Microscopy with Polarization Analysis (Simpa)

Published online by Cambridge University Press:  03 September 2012

N. J. Zheng  and
C. Rau
N. J. Zheng
Affiliation:
Department of Physics and Rice Quantum Institute, Rice University, Houston, TX 77251.
C. Rau
Affiliation:
Department of Physics and Rice Quantum Institute, Rice University, Houston, TX 77251.
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Abstract

We have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.

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References

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