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Semiconductor Resonant Tunneling Device Physics and Applications

Published online by Cambridge University Press:  28 February 2011

Mark A. Reed
Affiliation:
Central Research Laboratories, Texas Instruments Incorporated, P. O. Box 655936, M/S 154, Dallas, TX 75265, U.S.A
Alan C. Seabaugh
Affiliation:
Central Research Laboratories, Texas Instruments Incorporated, P. O. Box 655936, M/S 154, Dallas, TX 75265, U.S.A
Yung-Chung Kao
Affiliation:
Central Research Laboratories, Texas Instruments Incorporated, P. O. Box 655936, M/S 154, Dallas, TX 75265, U.S.A
John N. Randall
Affiliation:
Central Research Laboratories, Texas Instruments Incorporated, P. O. Box 655936, M/S 154, Dallas, TX 75265, U.S.A
William R. Frensley
Affiliation:
Central Research Laboratories, Texas Instruments Incorporated, P. O. Box 655936, M/S 154, Dallas, TX 75265, U.S.A
James H. Luscombe
Affiliation:
Central Research Laboratories, Texas Instruments Incorporated, P. O. Box 655936, M/S 154, Dallas, TX 75265, U.S.A
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Abstract

A discussion of resonant tunneling physics in both diode and transistor heterojunction structures is presented. It is evident the In(GaAI)As/InP system is significantly superior for this application. We also present results on resonant tunneling in lower dimensional systems.

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Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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