About this Cambridge Elements series
Elements in Microscopy and Microanalysis, which is published in collaboration with the Microscopy Society of America, provides focused reviews of foundational concepts and modern advances in microscopy-based imaging and spectroscopy techniques in a dynamic multi-media digital format. Specific Elements will offer review/tutorial treatments of key topics, ranging from fundamental theory, instrumentation advancements, experimental methods and data analysis, with cutting-edge insights into emerging applications in a variety of areas including biology, life sciences, geology, engineering, materials science, nanoscience, physics and archeology. With embedded video, code and data content, the Elements will serve as an excellent educational resource for the microscopy and the broader science community. Regularly updated and developed specifically for a digital environment, this series will be a dynamic and enduring reference resource for students, researchers, and practitioners in microscopy.
Contact the Series Editor
If you would like more information about this series, or are interested in writing an Element, please contact ecdickey@cmu.edu.
For more information about Elements, email athampi@cambridge.org.
Areas of Interest
Scope of the series includes, but is not limited to, the following:
Microscope instrumentation
Direct electron detectors
Correlative Bioimaging
Single-Particle CryoEM
CryoTomography
Cryo FIB
Plasma FIB
Atom Probe Tomography
Scanning Electron Microscopy
Light-sheet microscopy
Label-free imaging
Time-resolved spectroscopic imaging
Super-resolution data analysis
4DSTEM Data Analysis
Machine Learning in Microscopy
Uncertainty Quantification in Microscopy
STEM-EELS spectroscopy
Energy dispersive x-ray spectroscopy
Inelastic Scattering Simulation