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10 - Fundamentals of sampled-data circuits

Published online by Cambridge University Press:  17 December 2010

Márcio Cherem Schneider
Affiliation:
Universidade Federal de Santa Catarina, Brazil
Carlos Galup-Montoro
Affiliation:
Universidade Federal de Santa Catarina, Brazil
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Summary

The first part of this chapter is dedicated to the MOS sample-and-hold circuit (S/H). The main physical limitations of the MOS S/H, namely switch on-resistance, thermal noise, and switch charge injection, are reviewed. Distortion produced by the non-linear switch resistance is modeled and some circuit-linearization techniques for MOS switches are introduced as well as low-voltage circuit techniques. Finally, clock-jitter effects on the MOS S/H are modeled and these effects in analog-to-digital converters are commented on. The second part of the chapter presents the basics of switched-capacitor (SC) circuits. Parasitic insensitive integrators and second-order filters are reviewed. Amplifier specifications for SC circuits are detailed, as well as some circuit techniques to reduce the effects of op-amp imperfections. The important topic of SC circuits fully compatible with digital MOS technology ends the section on SC circuits. The last part of the chapter briefly introduces alternative switched circuits, specifically switched-MOSFET and switched-current filters.

MOS sample-and-hold circuits

Sample-and-hold (or track-and-hold) circuits are ubiquitous in signal-processing circuits. They are used at the front end of analog-to-digital (A/D) converters and at the back end of digital-to-analog (D/A) converters. The signal-to-noise ratio of an A/D converter is usually limited by the performance of the sample-and-hold block. Furthermore, precision analog integrated circuits are mostly implemented by sampled-data circuits in which the basic building block is the S/H.

Sample-and-hold basics

An ideal S/H is depicted in Figure 10.1. During the sampling mode, the switch S is on and the output voltage tracks the input voltage.

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Publisher: Cambridge University Press
Print publication year: 2010

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References

Razavi, B., Principles of Data Conversion System Design, Piscataway, NJ: IEEE Press, 1995.Google Scholar
Plassche, R., Integrated Analog-to-Digital and Digital-to-Analog Converters, Boston, MA: Kluwer, 1994.CrossRefGoogle Scholar
Zumbahlen, H., editor, Linear Circuit Design Handbook, Amsterdam: Elsevier/Newnes, 2008.
Gregorian, R. and Temes, G., Analog MOS Integrated Circuits for Signal Processing, New York: Wiley, 1986.Google Scholar
Niknejad, A. M. and Boser, B. E., Analog Integrated Circuits, EECS 240 Course Notes.
Walden, R. H., “Analog-to-digital converter survey and analysis,” IEEE Journal of Selected Areas in Communications, vol. 17, no. 4, pp. 539–550, Apr. 1999.CrossRefGoogle Scholar
Centurelli, F., Monsurro, P., and Trifiletti, A., “A model for the distortion due to switch on-resistance in sample-and-hold circuits,” Proceedings of IEEE ISCAS 2006, pp. 4787–4790.Google Scholar
Jaconis, D. and Svensson, C., “A 1 GHz linearized CMOS track-and-hold circuit,” Proceedings of IEEE ISCAS 2002, vol. 5, pp. 577–580.Google Scholar
Sheu, B. J. and Hu, C. M., “Switched induced error voltage on a switched capacitor,” IEEE Journal of Solid-State Circuits, vol. 19, no. 4, pp. 519–525, Aug. 1984.CrossRefGoogle Scholar
Temes, G. C., “Simple formula for estimation of minimum clock-feedthrough error voltage,” Electronics Letters, vol. 22, no. 20, pp. 1069–1070, Sep. 1986.CrossRefGoogle Scholar
Johns, D. A. and Martin, K., Analog Integrated Circuit Design, New York: Wiley, 1997.Google Scholar
Wegmann, G., Vittoz, E. A., and Rahali, F., “Charge injection in analog MOS switches,” IEEE Journal of Solid-State Circuits, vol. 22, no. 6, pp. 1091–1097, Dec. 1987.CrossRefGoogle Scholar
Enz, C. C. and Temes, G. C., “Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization,” Proceedings of the IEEE, vol. 84, no. 11, pp. 1584–1614, Nov. 1996.CrossRefGoogle Scholar
Lee, K.-L. and Meyer, R. G., “Low-distortion switched-capacitor filter design techniques,” IEEE Journal of Solid-State Circuits, vol. 20, no. 6, pp. 1103–1113, Dec. 1985.CrossRefGoogle Scholar
Farag, F. A., Galup-Montoro, C., and Schneider, M. C., “Digitally programmable switched-current FIR filter for low-voltage applications,” IEEE Journal of Solid-State Circuits, vol. 35, no. 4, pp. 637–641, Apr. 2000.CrossRefGoogle Scholar
Vittoz, E., “Micropower techniques,” in Design of Analog-Digital VLSI Circuits for Telecommunications and Signal Processing, 2nd edn., ed. Franca, J. E. and Tsividis, Y., Englewood Cliffs, NJ: Prentice-Hall, 1994, pp. 53–96.Google Scholar
Baschirotto, A., “A low-voltage sample-and-hold circuit in standard CMOS technology operating at 40 MS/s, IEEE Transactions on Circuits and Systems II, vol. 48, no. 4, pp. 394–399, Apr. 2001.CrossRefGoogle Scholar
Abo, A. M. and Gray, P. R., “A 1.5-V, 10-bit, 14.3-MS/s CMOS pipeline analog-to-digital converter,” IEEE Journal of Solid-State Circuits, vol. 34, no. 5, pp. 599–606, May 1999.CrossRefGoogle Scholar
Hosticka, B. J., Broderson, R. W., and Gray, P. R., “MOS sampled data recursive filters using switched capacitor integrators,” IEEE Journal of Solid-State Circuits, vol. 12, no. 6, pp. 600–608, Dec. 1977.CrossRefGoogle Scholar
Caves, J. T., Copeland, M. A., Rahim, C. F., and Rosenbaum, S. D., “Sampled analog filtering using switched capacitors as resistor equivalents,” IEEE Journal of Solid-State Circuits, vol. 12, no. 6, pp. 592–600, Dec. 1977.CrossRefGoogle Scholar
Bermudez, J. and Bhattacharyya, B., “A systematic procedure for generation and design of parasitic insensitive SC biquads,” IEEE Transactions on Circuits and Systems, vol. 32, no. 8, pp. 767–783, Aug. 1985.CrossRefGoogle Scholar
Laker, K. R. and Sansen, W. M. C., Design of Analog Integrated Circuits and Systems, New York: McGraw-Hill, 1994.Google Scholar
Schaumann, R. and Valkenburk, M. E., Design of Analog Filters, New York: Oxford University Press, 2000.Google Scholar
Haigh, D. G. and Singh, B., “A switching scheme for switched capacitor filters which reduces the effect of parasitic capacitances associated with switch control terminals,” Proceedings of IEEE ISCAS 1983, pp. 586–589.Google Scholar
Nicollini, G., Nagari, A., Confalonieri, P., and Crippa, C., “A −80 dB THD, 4 Vpp switched capacitor filter for 1.5 V battery-operated systems,” IEEE Journal of Solid-State Circuits, vol. 31, no. 8, pp. 1214–1219, Aug. 1996.CrossRefGoogle Scholar
Bermudez, J. C. M., Schneider, M. C., and Montoro, C. G., “Compatibility of switched capacitor filters with VLSI processes,” IEE Proceedings, Part G, vol. 139, no. 4, pp. 413–418, Aug. 1992.Google Scholar
Behr, A. T., Schneider, M. C., Filho, S. Noceti, and Montoro, C. G., “Harmonic distortion caused by capacitors implemented with MOSFET gates,” IEEE Journal of Solid-State Circuits, vol. 27, no. 10, pp. 1470–1475, Oct. 1992.CrossRefGoogle Scholar
Schneider, M. C., Galup-Montoro, C., and Bermudez, J. C. M., “Explicit formula for harmonic distortion in SC filters due to weakly nonlinear capacitors,” IEE Proceedings, Part G, vol. 141, no. 6, pp. 505–509, Dec. 1994.Google Scholar
Yoshizawa, H., Huang, Y., Ferguson, P. F., and Temes, G. C., “MOSFET-only switched-capacitor circuits in digital CMOS technology,” IEEE Journal of Solid-State Circuits, vol. 34, no. 6, pp. 734–747, June 1999.CrossRefGoogle Scholar
Hughes, J. B., Bird, N. C., and Macbeth, I. C., “Switched current – a new technique for analog sampled-data signal processing,” Proceedings of IEEE ISCAS 1989, pp. 1584–1587.Google Scholar
Hughes, J. B., Macbeth, I. C., and Pattullo, D. M., “Switched current filters,” IEE Proceedings, Part G, vol. 137, no. 2, pp. 156–162, Apr. 1990.Google Scholar
Fiez, T. S., Liang, G., and Allstot, D. J., “Switched current circuit design issues,” IEEE Journal of Solid-State Circuits, vol. 26, no. 3, pp. 192–202, Mar. 1991.CrossRefGoogle Scholar
Barnett, R. and Harjani, R., “A 200 MHz differential sampled data FIR filter for disk drive equalization,” Proceedings of IEEE ISCAS 1996, vol. 1, pp. 429–432.Google Scholar
Brown, T. W., Fiez, T. S., and Hakkarainen, M., “Prediction and characterization of frequency dependent MOS switch linearity and the design implications,” CICC Technical Digest, pp. 237–240, Sep. 2006.Google Scholar

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