Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
Hostname: page-component-848d4c4894-wg55d Total loading time: 0 Render date: 2024-05-15T23:34:05.694Z Has data issue: false hasContentIssue false

11 - TDR-based S-parameters

from Part III - Linear measurements

Published online by Cambridge University Press:  05 June 2013

By
Peter J. Pupalaikis  and
Kaviyesh Doshi
Edited by
Valeria Teppati ,
Andrea Ferrero  and
Mohamed Sayed
Peter J. Pupalaikis
Affiliation:
Teledyne LeCroy
Kaviyesh Doshi
Affiliation:
Teledyne LeCroy
Valeria Teppati
Affiliation:
Swiss Federal University (ETH), Zürich
Andrea Ferrero
Affiliation:
Politecnico di Torino
Mohamed Sayed
Affiliation:
Microwave and Millimeter Wave Solutions, Santa Rosa
Get access

Summary

Introduction

Many engineers are familiar with the VNA as an instrument for measuring S-parameters. The VNA's origins lie in microwave systems analysis and its application has been primarily in the frequency domain. Many are also familiar with the use of TDR for making qualitative measurements of time domain reflections and other phenomena. TDR has its origins in signal integrity analysis, as signal integrity is primarily concerned with time domain effects.

It is less well known that TDR and associated TDT is also a highly useful technique for precise quantitative measurements in signal integrity and can be used effectively for S-parameter measurement.

This chapter deals with the measurement of S-parameters using time domain techniques such as found in TDR and TDT. We cover the topic by first describing the hardware architecture of TDR instruments including the sampling system, the pulser, and the timebase. Then we describe how time domain TDR and TDT measurements are converted to raw, uncalibrated, frequency domain S-parameters. We do not deal with calibration techniques as these are the same for the VNA and TDR once raw S-parameters have been determined. Then, we quantitatively discuss the main element that effects the accuracy of time domain measurements: that of noise or SNR. SNR is such a big problem that it is the major source of error in time domain derived S-parameters and it is worthwhile understanding the sources of dynamic range degradation in TDR systems and the key design areas for improvement.

Type
Chapter
Information
Modern RF and Microwave Measurement Techniques , pp. 279 - 306
Publisher: Cambridge University Press
Print publication year: 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] M. J. W., Rodwell, D. M., Bloom, and B. A., Auld, “Nonlinear transmission line for picosecond pulse compression and broadband phase modulation,” Electronics Letters, vol. 23, p. 109, Jan. 1987.Google Scholar
[2] R. J., Baker, D. J., Hodder, B. P., Johnson, P. C., Subedi, and D. C., Williams, “Generation of kilovolt-subnanosecond pulses using a nonlinear transmission line,” Measurement Science and Technology, vol. 4, pp. 893–895, 1993.Google Scholar
[3] J. R., Andrews, B. A., Bell, and E. E., Baldwin, “Reference at pulse generator – Technical note,” National Bureau of Standards, Boulder, CO. National Engineering Lab, Oct 1983. Report Number NBS-TN-1067.Google Scholar
[4] A., Agoston, J. B., Rettig, S. P., Kaveckis, J. E., Carlson, and A. E., Finkbeiner, “Dual channel time domain reflectometer,” July 1988. U.S. Patent 4 755 742.Google Scholar
[5] A., Agoston and J. E., Carlson, “Fast transition flat pulse generator,” July 1988. U.S. Patent 4 758 736.Google Scholar
[6] M., Kahrs, “50 years of RF and microwave sampling,” IEEE Trans. Microw. Theory Tech., vol. 51, pp. 1787–1805, June 2003.Google Scholar
[7] R., Miller, “Waveform translator for DC to 75 GHZ oscillography,” June 2001. U.S. Patent 6 242 899.Google Scholar
[8] S., Ems, S., Kreymerman, and P. J., Pupalaikis, “Time domain reflectometry in a coherent interleaved sampling timebase,” September 2010. U.S. Patent Application 12/888 550.Google Scholar
[9] R. L., Graham, D. E., Knuth, and O., Patashnik, Concrete Mathematics: a foundation for computer science. Addison-Wesley Professional, 1994.Google Scholar
[10] L. A., Hayden and V. K., Tripathi, “Characterization and modeling of multiple line interconnections from TDR measurements,” IEEE Trans. Microw. Theory Tech., vol. 42, pp. 1737–1743, September 1994.Google Scholar
[11] D. A., Smolyansky and S. D., Corey, “PCB interconnect characterization from TDR measurements,” Printed Circuit Design Magazine, May 1999. TDA Systems App. note PCBD-0699-02.Google Scholar
[12] W. L., Gans and N. S., Nahman, “Continuous and discrete Fourier transform of step-like waveforms,” IEEE Trans. Instrum. Meas., vol. IM-31, pp. 97–101, June 1982.Google Scholar
[13] A. M., Nicolson, “Forming the fast Fourier transform of a step response in time domain metrology,” Electron. Lett., vol. 9, pp. 317–318, July 1973.Google Scholar
[14] P., Pupalaikis, “Wavelet denoising for TDR dynamic range improvement,” in DesignCon, IEC, February 2011.Google Scholar
[15] P., Pupalaikis, “The relationship between discrete-frequency S-parameters and continuous-frequency responses,” in DesignCon, IEC, February 2012.Google Scholar
[16] M. T., Jong, Methods of Discrete Signal and System Analysis. McGraw-Hill, 1982.Google Scholar
[17] P., Wittwer and P. J., Pupalaikis, “A general closed-form solution to multi-port scattering parameter calculations,” in 72nd ARFTG Conference Digest, p. 137, 2008.Google Scholar
[18] A., Ferrero, M., Garelli, B., Grossman, S., Choon, and V., Teppati, “Uncertainty in multiport S-parameters measurements,” Microwave Measurement Conference (ARFTG), 2011 77th ARFTG, pp. 1–4, June 2011.Google Scholar
[19] METAS VNA Tools II [Online]. Available: http://www.metas.ch/metasweb/Fachbereiche/Elektrizitaet/HF/VNATools/VNATools.html.

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×