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LiCu2O2 crystals grown by spontaneous crystallization from the fluxed melt were studied by powder X-ray diffraction. The phase analysis shows that the applied growth conditions are suitable for preparation of a single-phase compound. The as-grown crystals contain only traces of foreign phases (Li2CuO2, CuO, Cu2O) typical for preparation of the LiCu2O2 compound. Attempts to anneal or quench the as-grown crystals led to two-phase samples containing LiCu2O2 and LiCu3O3. X-ray powder diffraction pattern of a LiCu2O2 crystal is reported and compared with literature data. The crystal structure is orthorhombic, space group Pnma, in agreement with literature data. Lattice parameters of the studied sample are a=5.7286(2) Å, b=2.8588(1) Å, and c=12.4143(3) Å. Time evolution of a diffraction pattern illustrates a slow increase of the secondary-phases contribution assumed to be due to interaction of the powdered crystal with humid air. A brief summary of compounds known in the Li–Cu–O system is included
A new copper phosphate, CuPO4H⋅0.5H2O, was synthesized using a low temperature hydrothermal method and characterized by powder X-ray diffraction, thermogravimetric analysis, and chemical analysis. The material is monoclinic, space group P21/c, with a=10.6524(2), b=8.4730(2), c=9.2204(2), β=92.43(0), and V=831.47 Å3.
Ca3−xSrxCo4O9 with different compositions (x=0, 0.15, 0.3, and 0.45) were synthesized from stoichiometric mixtures of Co3O4, CaCO3, and SrCO3, and their unit-cell parameters were determined. The powders were mixed with silicon standard powder, and XRD patterns were collected and analyzed using TOPAS. The compounds were determined to be monoclinic with space group of P2. Unit-cell parameters changed from a=4.8329(3) Å, b=4.5727(1) Å, c=10.8360(4) Å, and β=98.093(7)° when x=0, to a=4.8432(1) Å, b=4.6100(3) Å, c=10.8668(3) Å, and β=98.110(5)° when x=0.3. An unidentified second phase was observed when x=0.45.
Powder diffraction data and refined unit cell parameters of two palladium borides were determined. For Pd3B (space group Pnma; Fe3C type) it was found that a=0.54602(3) nm, b=0.75596(4) nm, c=0.48417(4) nm and for Pd5B2 (space group C2/c; Mn5C2 type) a=1.27759(12) nm, b=0.49497(5) nm, c=0.54704(4) nm, β=97.049(7)°. Further, it was shown that the position of the principal scattering peak of the amorphous Pd2B fulfils the Nagel–Tauc criterion about glass forming ability.
X-ray powder diffraction data, unit-cell parameters and space group for a new chiral Kemp’s acid diamide, C18H28N2O3, are reported [a = 12.456(2) Å, b = 12.471(2) Å, c = 12.088(2) Å, β = 99.003(2)°, unit-cell volume V = 1854,48 Å3, Z = 4, space group P21]. All measured lines were indexed and are consistent with the P21 space group. No detectable impurity was observed.
Calcium hydroxyapatite (Ca10(PO4)6(OH)2) whiskers were prepared by using the technique of molten salt synthesis with the fluxing agent of potassium sulphate (K2SO4). A tentative x-ray diffraction (XRD) pattern was suggested for the produced whiskers. Phase purity, composition, and morphology of the whiskers were investigated by powder XRD, inductively coupled plasma-atomic emission spectroscopy, Fourier transform infrared spectroscopy, and scanning electron microscopy, respectively.
X-ray powder diffraction data are reported for a series of multipyrazole compounds in this paper. This work shows that the unit cell dimensions determined by single crystal agree well with those of powder diffraction analysis.
Methods of chemical preparation and crystallographic data are reported for four new condensed phosphates: one hydrated cyclotriphosphate MnAg4(P3O9)2·6H2O and three long-chain polyphosphates: MnAg2(PO3)4, NiAg4(PO3)6 and NiNa4(PO3)6. Two of these new condensed phosphates, associated with manganese, belong to previously investigated structure types.
The structure of BaSrR4O8 (where R=La, Nd, Sm, Gd, Eu, Dy, Ho, Y, Er, Tm, Yb, and Lu) has been investigated, and the X-ray reference patterns of these compounds have been prepared using the Rietveld refinement technique. BaSrR2O4 are isostructural to BaR2O4, which have the CaFe2O4 structure type (orthorhombic, Pnam). The cell parameters of these compounds (R=Lu to La) range from 10.125 04(10) to 10.5501(8) Å for a, 3.362 49(3) to 3.692 04(24) Å for b, 11.846 91(13) to 12.5663(9) Å for c, and 403.33 to 489.47 Å3 for V, respectively. There is a linear relationship between V and the Shannon ionic radius of R. Unlike the BaR2O4 compositions (R=Tm, Lu, and Yb), which produced a mixture of Ba3R4O9 and unreacted lanthanide oxides, single-phase BaSrTm4O8, BaSrLu4O8, and BaSrYb4O8 were successfully prepared.
A lattice metric singularity occurs when unit cells defining two (or more) lattices yield the identical set of unique calculated d-spacings. The existence of such singularities, therefore, has a practical impact on the indexing of powder patterns. Lattice metric singularities often involve lattices that are in a derivative relationship one to another. A variety of types of singularities are possible depending on the number of different lattices involved (i.e., binary, ternary, quaternary), on the nature of the derivative lattice relationship (i.e., subcell/supercell, composite), on the Bravais type of each of the lattices, and on the the volume ratio(s) of primitive cells defining the lattices. In the laboratory, an encounter with a singularity can lead one into a trap; viz., the investigator using an indexing program, or by other means, may determine only one of the lattices with a high figure of merit. When this happens, it is critical to recognize that there exists more than one indexing solution. In a previous work, a binary singularity was described involving a monoclinic and a rhombohedral lattice. In the present work, we describe a second type of singularity—a ternary singularity—in which the two of the three lattices are in a derivative composite relationship.
Retained austenite is an important characteristic of properly heat-treated steel components, particularly gears and shafts, that will be subjected to long-term use and wear. Normally, either X-ray diffraction or optical microscopy techniques are used to determine the volume percent of retained austenite present in steel components subjected to specific heat-treatment regimes. As described in the literature, a number of phenomenological, experimental, and calculation factors can influence the volume fraction of retained austenite determined from X-ray diffraction measurements. However, recent disagreement between metallurgical properties, microscopy, and service laboratory values for retained austenite led to a re-evaluation of possible reasons for the apparent discrepancies. Broad, distorted X-ray peaks from un-tempered martensite were found to yield unreliable integrated intensities whereas diffraction peaks from tempered samples were more amenable to profile fitting with standard shape functions, yielding reliable integrated intensities. Retained austenite values calculated from reliable integrated intensities were found to be consistent with values obtained by Rietveld refinement of the diffraction patterns. The experimental conditions used by service laboratories combined with a poor choice of diffraction peaks were found to be sources of retained austenite values containing significant bias.
A qualitative phase identification system for crystalline mixtures is presented. The system provides up to five-phase qualitative identification using up to nine-peak filtration, and additive full peak matching based on the powder diffraction file of ICDD. It was implemented using Microsoft Visual C++, and runs under most common Windows systems. Screenshots and examples are included.
The crystal structures of marialite (Me6) from Badakhshan, Afghanistan and meionite (Me93) from Mt. Vesuvius, Italy were obtained using synchrotron high-resolution powder X-ray diffraction (HRPXRD) data and Rietveld structure refinements. Their structures were refined in space groups I4/m and P42/n, and similar results were obtained. The Me6 sample has a formula Ca0.24Na3.37K0.24[Al3.16Si8.84O24]Cl0.84(CO3)0.15, and its unit-cell parameters are a=12.047555(7), c=7.563210(6) Å, and V=1097.751(1) Å3. The average ⟨T1-O⟩ distances are 1.599(1) Å in I4/m and 1.600(2) Å in P42/n, indicating that the T1 site contains only Si atoms. In P42/n, the average distances of ⟨T2-O⟩=1.655(2) and ⟨T3-O⟩=1.664(2) Å are distinct and are not equal to each other. However, the mean ⟨T2,3-O⟩=1.659(2) Å in P42/n and is identical to the ⟨T2′-O⟩=1.659(1) Å in I4/m. The ⟨M-O⟩ [7]=2.754(1) Å (M site is coordinated to seven framework O atoms) and M-A=2.914(1) Å; these distances are identical in both space groups. The Me93 sample has a formula of Na0.29Ca3.76[Al5.54Si6.46O24]Cl0.05(SO4)0.02(CO3)0.93, and its unit-cell parameters are a=12.19882(1), c=7.576954(8) Å, and V=1127.535(2) Å3. A similar examination of the Me93 sample also shows that both space groups give similar results; however, the C–O distance is more reasonable in P42/n than in I4/m. Refining the scapolite structure near Me0 or Me100 in I4/m forces the T2 and T3 sites (both with multiplicity 8 in P42/n) to be equivalent and form the T2′ site (with multiplicity 16 in I4/m), but ⟨T2-O⟩ is not equal to ⟨T3-O⟩ in P42/n. Using different space groups for different regions across the series implies phase transitions, which do not occur in the scapolite series.
Polycrystalline AgIn3Te5 synthesized by melt-quench technique has been analyzed using proton induced X-ray emission (PIXE), X-ray diffraction (XRD), and selected area electron diffraction. PIXE analysis yielded the content of Ag, In, and Te, respectively, to be 9.76%, 31.18%, and 59.05% by weight. Structure refinement was carried out considering those space groups from I- and P-type tetragonal systems which possess 4 symmetry and preserve the anion sublattice arrangement of the chalcopyrite structure (space group: I42d) as well. The results showed that AgIn3Te5 synthesized by melt-quench method crystallizes with P-type tetragonal structure (space group: P42c; unit-cell parameters a = 6.2443(8) and c = 12.5058(4) Å), the presence of which was corroborated by selected area electron diffraction studies.
We reported the surface morphology and electrical property of super-thin Pt films, ∼2 nm thick, deposited on 6H-SiC (0001) substrates and subsequently annealed from 400 to 1000 °C. The surfaces of the films were found to have a feature of islands growth, and the sizes of the islands increased with increasing annealing temperature. Free carbon, produced by selective reactions between Pt and SiC, diffused toward the top surface across the product layers due to low solubility and composition gradient of carbon throughout the reaction zone. A dramatic change of electrical conductivity of the films was observed. A mechanism analysis reveals that the origin came from the contribution of aggregation of islands on the surface and formation of Pt silicides and a thin layer of crystalline graphite.