An Excel command macro has been developed which directly transforms X-ray powder diffraction data to a spreadsheet format. This spreadsheet format offers a number of data reduction and plotting capabilities not available in a diffractometer's software. The conventional approach uses computer programs to transform the data outside a spreadsheet. The development of these programs is not a simple process, and requires the user to be familiar with computer programming and the software of a diffractometer. Furthermore, these programs are diffractometer-specific. A different approach is followed in which an Excel macro transforms the data within a spreadsheet. This macro, with minor modifications, can be applied generally to treat data from any diffractometer. A copy of the macro and an example illustrating its working principle are included.

A Siemens D500 powder diffractometer has been modified to accommodate data collection and storage by an IBM microcomputer. The interface mechanism, described in detail, is simple, versatile and relatively low cost. The system performance is evaluated and further enhancements suggested.

The correct formulas for geometrical factors for correction of diffracted intensities in Seemann-Bohlin diffractometry were tested. A Huber 653 goniometer, gold and titanium nitride layers, white tin, and rutile as specimens were used in the reflection mode. A Huber 642 goniometer and olivine as a specimen were used in the transmission mode. It was found that, due to a variable specimen-detector distance during 2θ scan, the variable efficiency of the Soller slits in the diffracted beam must be taken into account. The model describing this effect analytically is presented. As a final test the structures of white tin, rutile, and olivine were refined from the measured data corrected for different factors.

The crystal structure of the Aurivillius compound Bi2BaTa2O9 prepared via the chemical route was determined by direct methods using EXPO97, and refined using the Rietveld method with conventional X-ray diffraction data. The structure was found to be tetragonal (space group I4/mmm, number 139) and Z=2, isomorphic of the Bi2BaNb2O9 reported by Blake and co-workers in the literature (1997). Two refinements were performed using the two asymmetry functions of DBWS-9807 (release 20/May/99). The unit cell for each case are: a=3.932 22(6) Å, c=25.5053(6) Å (RA) and a=3.932 50(7) Å, c=25.5069(6) Å (RCF). The differences for atom positions, interatomic distances and angles are in the range of one standard deviation. Final agreements factors are: Rwp=7.97%, S=1.84, RBragg=4.28%(RA), Rwp=7.98%, S=1.84, RBragg=4.30%(RCF). The occupancies of Ba and Bi in site 2b were refined but constrained to have their summation equal to 1.00. The same constraints were applied to the Ba and Bi of the 4e site. The results show that on site 2b there are 70% of Ba and 30% of Bi and on the site 4e there are 82% of Bi and 18% of Ba. The charge equilibrium is maintained for one standard deviation of the site occupancies.© 2000 International Centre for Diffraction Data.

Simple relationships exist between the individual phase scale factors derived from Rietveld analysis of multiphase mixtures and (i) the ‘reference intensity ratio’ used in traditional methods of discrete-peak phase analysis, (ii) the phase abundance itself and (iii) the relative pattern intensities in simulated powder patterns. These relationships are shown to follow naturally from the fundamental integrated-intensity phase-analysis equations provided in standard texts. In the event that preferred orientation, crystallinity, extinction and/or microabsorption cannot be adequately incorporated into the Rietveld models for individual phases, it is demonstrated that the Rietveld ab initio ‘pattern intensity constants’ can be scaled/calibrated experimentally, as in other whole-pattern methods of analysis, while retaining all the advantages of the Rietveld method.

Surface roughness of planar samples causes an additional attenuation of X-ray diffraction intensity measured in Bragg–Brentano geometry. The decrease of intensity becomes stronger with decreasing scattering angle. This is part of the microabsorption effect. Two quantitative expressions describing the microabsorption effect are incorporated into the DBWS 9006-PC Rietveid program [D. B. Wiles and R. A. Young, J. Appl. Crystallogr. 15, 149–151 (1981)]. The procedure is applied to scattering data obtained from YBa2Cu3O7-powder samples with different degree of surface roughness but approximately identical bulk structure. The procedure is proved to work well. However, the values obtained for the parameters of the temperature factors and the microabsorption effect are correlated, and careful discussion is necessary to interpret the results.

X-ray powder patterns for the phases in the CaO-SrO-CuO ternary system, along with the corresponding crystal structures, were obtained from the literature and from the Powder Diffraction File. Available XRD patterns were compared with each other and with a calculated pattern for each phase, yielding a recommended reference pattern. The simulated powder patterns presented here deal with the phases found within the (Ca,Sr)O, (Ca,Sr)2CuO3, (Ca,Sr)14Cu24O41, (Ca,Sr)CuO2, (Ca,Sr)Cu2O3, and (Ca,Sr)Cu2O2 solid solution series and are recommended for the Powder Diffraction File (PDF).

Two derivatives of 4-chloro-2,2′-iminodibenzoic acid: diethyl 4-chloro-2,2′-iminodibenzoate, C18H18ClNO4, and dimethyl 4-chloro-2,2′-iminodibenzoate C16H14ClNO4, have been investigated by means of X-ray powder diffraction. The unit cell dimensions were determined from diffractometer methods, using monochromatic CuKα1 radiation, and evaluated by indexing programs. The monoclinic cell found for diethyl 4-chloro-2,2′-iminodibenzoate was a=21.332(3) Å, b=7.889(2) Å, c=10.156(2) Å, β=91.43(1)°, Z=4, space group P2 (No. 3), Pm (No. 6), or P2/m (No. 10), Dx=1.351 mg/m3. The cell found for this compound is in good agreement with the one obtained from single crystal X-ray diffractometry. The monoclinic cell found for dimethyl 4-chloro-2,2′-iminodibenzoate has the dimensions a=15.962(2) Å, b=5.151(2) Å, c=12.590(2) Å, β=98.35(1)°. Z=4, space group P2 (No. 3), Pm (No. 6), or P2/m (No. 10), Dx=2.073 mg/m3.

The mathematical relationships are developed which are pertinent to the quantitative analysis of powder mixtures for the case of diffraction from the surface of a flat powder specimen. These formulas relate the diffracted intensity to the absorptive properties of the sample. Three important cases are treated: (1) Mixture of n components; absorbing powder of the unknown equal to that of the matrix; concentration proportional to intensity. Direct analysis is permitted. (2) Binary mixture; absorbing powder of the unknown not equal to that of the diluent; concentration not proportional to intensity. Direct analysis is possible by means of calibration curves prepared from synthetic mixtures. (3) Mixture of n components; absorbing power of the unknown not equal to that of the matrix; general case. Analysis is accomplished by the addition of an internal standard. Concentration is proportional to the ratio of the intensity of a selected reflection from the unknown to the intensity of a reflection from the internal standard.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

The indexed X-ray diffraction powder data of trans-bis(dimethylphenylphosphine)bis(pyrazole)platinum, {Pt(C3H4N2)2[P(CH3)2(C6H5)]2, PTPP} and trans-(tricyclohexylphosphino) (triethylphosphino) platinum(II) chloride, (PtCl2P2C24H48, PTHE) are reported. PTPP crystallizes in the monoclinic space group C2/c and PTHE crystallizes in the orthorhombic space group Pcab. The refined cell parameters were determined by employing a Siemens Debye-Scherrer camera (Fe radiation, λmean = 1.93736 Å). The cell constants are a = 21.516(5), b = 6.287(1), c = 17.929(4)Å, β = 102.51(1)°, V = 2367.7Å3 Dx=1.70Mg m−3, Dm = 1.70Mg m−3 for PTPP and a = 12.271(1), b = 19.375(1), c = 23.864(3)Å, V = 5673.4Å3, Dx = 1.553Mg m−3 for PTHE. The quantitative figures of merit (FN) are F23 = 47(0.010,51) [F20 = 60(0.009,35)] for PTPP and F30 = 12(0.008,324) [F20 = 27(0.017,105)] for PTHE. The JCPD S Diffraction File No. for PTPP is 37-1999 and for PTHE is 37-2000.

The error is investigated which results from the employment of tangential approximation in the calculation of line shift caused by specimen displacement from the recording circle in focusing systems (Guinier, Seemann–Bohlin). After an exact expression has been deduced and compared with the approximate formula in a numerical example, it is concluded that the error caused by the approximate formula may be important only in exceptional cases. The deduced exact formula is also compared with that given by Rafaja and Valvoda [Powder Diffr. 6, 200–203 (1991)] with the conclusion that both formulas are mathematically equivalent and complementary with respect to the theoretical and measured values of the diffraction angle 2θ.

The X-ray powder diffraction patterns for tetramethylammonium bromide and iodide have been measured from near room temperature up to decomposition/sublimation. The unit cell parameters were refined and the coefficients of thermal expansion calculated. Unlike N(CH3)4Cl [M. Stammler, J. Inorg. Nucl. Chem. 29, 2203–2221 (1967)], N(CH3)4Br (1Br) and N(CH3)4I (1I) undergo no solid–solid transitions before decomposition/sublimation as was observed earlier by thermal analysis [S. S. Chang and E. F. Westrum, J. Chem. Phys. 36(9), 2420–2423 (1962); Coulter etal., J. Am. Chem. Soc. 62, 2845–2851 (1940); Xenopoulos etal., Mol. Cryst. Liq. Cryst. 214, 63–79 (1992)].

Powder X-ray diffraction was used to investigate the solid solution range of the Bi14SrxCa12−xO33 series in the Bi–Sr–Ca–O system. Solid solution forms over the range 1≤x≤7 in Bi14SrxCa12−xO33. Experimental X-ray reference patterns of selected members with x=1, 3, 5, and 7 have been prepared for the powder diffraction file (PDF). These phases are monoclinic, C2/m, with cell parameter a ranging from 21.473(4) to 21.868(4) Å, b from 4.3564(9) to 4.3898(9) Å, c from 12.753(2) to 12.962(2) Å, β from 102.91(2)° to 102.79(1)°, and V from 1162.9(3) to 1213.5(3) Å3, respectively. These parameters increase monotonically as Ca is continuously replaced by the larger Sr.

The X-ray powder diffraction pattern for the title compound is reported in the range 5 ≤ 2θ ≤ 125°. The sample was prepared through solid-state reaction of BaCO3, CuO, and Pr6O11, and characterized with respect to oxygen content through iodometric titration. Refined parameters for the orthorhombic (space group Pmmm) unit cell are a = 3.8587(2) Å; b = 3.9302(1) Å; c= 11.7126(3) Å; a/b = 0.98181(6); a/c = 0.32945(2); b/c = 0.33555(1); Z = 1; Dx = 6.705(2) Mg m−3; V = 177.62(1) Å3; formula wt. = 717.48(16) g mol−1; SS/FOM: F30 = 48(0.005,127).