The recent advances in levitation methods for materials processing now enable structural, thermo-physical property, and phase transition studies to be made on high temperature solids and liquids without container contamination. These studies have led to new insights into the liquid state and have revealed how local order in the liquid can dictate phase formation. In this article, levitation techniques are briefly discussed, focusing most on electrostatic levitation. Recent synchrotron studies of electrostatically levitated undercooled Ti–Zr–Ni liquids are presented, which demonstrate that developing icosahedral short-range order in the liquid causes the nucleation of a metastable icosahedral quasicrystal instead of the stable tetrahedral Laves phase. In addition to providing the first experimental proof of a half-century-old hypothesis linking the order of the liquid with the nucleation barrier, these data raise new questions about the general applicability of the thermodynamic model assumed in the classical theory of nucleation. The combination of electrostatic levitation and synchrotron high-energy x-ray diffraction also allows rapid and accurate determinations of phase diagrams for high temperature materials. This is demonstrated usingTi–Fe–Si–O as a case study. This new technique, then, is of practical as well as basic importance.

Laboratory powder X-ray microdiffraction with a focusing monocapillary and linear multichannel detector was applied to phase identification in fragments of painting layers of art works, canvas and wall paintings, and polychromes on wood. This method is useful in materials research of painting layers with complex stratigraphy, and it is indispensable in distinguishing inorganic pigments of different natural provenance and revealing degradation products. The advantage of X-ray microdiffraction is its nondestructive nature and no need of sample pretreatment. Samples after microdiffraction can hence be used for other analyses or archived. Another advantage is the possibility to work with samples smaller than 1 mm, which is particularly important in the analysis of artworks where the sample amount or size is a serious limit of using the laboratory techniques of materials research. The X-ray equipment used is more economical and more easily accessible than other microdiffraction techniques and is, hence, suitable for routine analytical work.

Neutron diffraction studies were carried out to ascertain the structural details of the composition Ce0.5Nd0.5O1.750. The structure was unequivocally found to be that of C-type cubic. The refinement on an F-type cubic lattice was found to be unacceptable because of high R values. Selected bond distances are also being reported. In addition, the neutron diffraction studies on a typical defective F-type composition Ce0.75Nd0.25O1.875 were also carried out.

Quantification of mixtures via the Rietveld method is generally restricted to crystalline phases for which structures are well known. Phases that have not been identified or fully characterized may be easily quantified as a group, along with any amorphous material in the sample, by the addition of an internal standard to the mixture. However, quantification of individual phases that have only partial or unknown structures is carried out less routinely. This paper presents methodology for quantification of such phases. It outlines the procedure for calibration of the method and gives detailed examples from both synthetic and mineralogical systems. While the method should, in principle, be generally applicable, its implementation in the TOPAS program from Bruker AXS is demonstrated here.

An experimental X-ray powder diffraction pattern was produced and analyzed for alpha-polymorphic tegafur, also called Ftorafur (an antineoplastic agent). The indexed data matched the powder patterns in the ICDD PDF-4/Organics database calculated from the reported single-crystal X-ray diffraction data in the Cambridge Structural Database. Alpha tegafur has a triclinic crystal system, with reduced cell parameters of a=16.720(6) Å, b=9.021(5) Å, c=5.995(3) Å, α=93.66(4)°, β=93.15(8)°, γ=100.14(4)°. There are four formula units contained in one unit cell. The cell volume and space group were determined to be 886.27 Å3 and P-1, respectively.

The method of high-energy total elastic X-ray scattering to determine the atomic structure of nanocrystalline, highly disordered, and amorphous materials is presented. The current state of the technique, its potential, and limitations are discussed with two successful studies on the pressure induced phase transition in mackinawite (FeS) and the high-pressure behavior of liquid gallium.

Crystal structures of (NH4)2KWO3F3 at 298 K and 113 K were solved from X-ray powder diffraction data and refined by the Rietveld technique. The compound is isostructural with elpasolite K2NaAlF6 at room temperature with space group Fm-3m, a=8.95850(5) Å, V=718.961(7) Å3, Z=4, Dx=3.363 g/cm3, and MW=364.02. The structure was refined over 18 parameters to Rwp=12.6%, Rp=10.9%, Rexp=5.03%, and RB=3.27% from 40 independent reflections. (NH4)2KWO3F3 was transformed upon cooling to a ferroelastic monoclinic phase with space group P21/n, a′=6.3072(3) Å, b′=6.3028(3) Å, c′=8.9882(3) Å, β′=90.242(2)°, V=357.30(3) Å3, Z=2, and Dx=3.383 g/cm3. The low-temperature structure at 113 K was refined over 28 parameters to Rwp=20.9%, Rp=21.3%, Rexp=12.5%, and RB=6.93% from 453 independent reflections.

High-precision unit-cell parameters for the TiO2 polymorphs anatase and rutile at temperatures between 300 and 575 K have been determined using Rietveld analysis of synchrotron powder XRD data. Polynomial models were used to express the tetragonal unit-cell parameters as a function of absolute temperature, with a (anatase)=1.759 37×10−8×T2+6.418 16×10−6×T+3.779 84, c (anatase)=6.6545×10−8×T2+4.0464×10−5×T+9.4910, V (anatase)=2.237 58×10−6×T2+1.027 77×10−3×T+135.602, a (rutile)=−6.636 42×10−11×T3+1.005 01×10−7×T2−1.009 9310−5×T+4.586 34, c (rutile)=−4.115 50×10−11×T3+6.405 94×10−8×T2+4.675 61×10−7T+2.951 81, and V (rutile)=−2.7790×10−9×T3+4.2386×10−6×T2−3.3551×10−4×T+62.100. The polynomial expressions were used to calculate linear (α) and volume (β) thermal expansion coefficients of anatase and rutile between 300 and 575 K. At 298.15 K, these values were αa=4.46943×10−6 K−1, αc=8.4283×10−6 K−1, and β=17.3542×10−6 K−1 for anatase, and αa=6.99953×10−6 K−1, αc=9.36625×10−6 K−1, and β=28.680×10−6 K−1 for rutile.

Nanocrystallized oxide precursors of colored (oxy)nitrides related to the system Yb-(Zr-W)-O have been successfully prepared using a chimie douce process—the amorphous citrate route. The process involves first a formation of fine and homogeneous powdered solids obtained by calcination at 600 °C, a temperature much lower than that of the conventional solid-state method. At this stage, the X-ray diffraction patterns exhibit large line broadening effects. Finally, two well-crystallized and pure quaternary oxides have been readily obtained by heating and under annealing conditions at 850 and 900 °C for 12 h. For one of the patterns, all the X-ray diffraction lines can be easily indexed to a cubic phase with the fluorite structure conforming to the Fm3m space group [Yb2Zr1.21W0.41O6.65◻1.35 called C-phase: a=5.1864(2) Å]. The second phase adopts the sheelite-type structure [Yb2ZrWO8 called T-phase: space group I41/a, a=5.1584(5), and c=10.8246(6) Å]. By taking into account the present compositions determined by EDS measurements, Rietveld structure refinements produce final RB factors of 0.015 and 0.044, and Rwp factors of 0.069 and 0.089, respectively. In order to characterize the microstructure of the materials (crystallite size and lattice distortion) at the nanometer scale, a study based on diffraction line broadening analysis applying the whole pattern refinement method was also undertaken with confidence. The results show smooth angular variations of the values of FWHMs, indicating that the microstructural properties are isotropic for the cubic and tetragonal oxides. More precisely, the results indicate that whatever the profile fitting approach used (“profile matching” procedure and Rietveld method), the reliability factors Rwp are systematically better with a combined size strain than with zero strain considerations. The strain magnitudes observed for the C-phase-850 °C as well as for the T-phase-900 °C should be viewed as realistic strain.

We report on the use of a microcalorimeter X-ray detector with a transition edge sensor in an electron probe to perform quantitative analysis. We analyzed two bulk samples of multielement glasses that have been previously characterized by chemical methods for use as standard reference materials. The spectra were analyzed against standards using three different correction schemes. In one of the standards, the reference line was easily resolved despite its proximity within 45 eV of another line. With the exception of direct measurements of oxygen (a particularly challenging element), the results are in agreement with the certified characterization to better than 1% absolute or 8% relative. This demonstrates the potential of microcalorimeter detectors as replacements for conventional energy dispersive detectors in applications requiring high energy resolution.

Polycrystalline TiN/SiNx multilayer coatings were deposited by reactive magnetron sputtering from Ti and Si targets. Interfaces, structures, and mechanical properties of the multilayers were characterized using X-ray reflectivity (XRR), X-ray diffraction (XRD), and nanoindentation analyses. Results showed that substrate bias voltage had a significant influence on the structures and mechanical properties of the multilayer coatings, in which sharp interfaces are responsible for an enhancement of mechanical properties of the multilayer coatings. The maximum hardness occurs at the −80 V coating with the sharpest interface and the strongest [200] preferred orientation.

The diffraction pattern of nanocrystalline Ce0.9Zr0.1O2 was analyzed by whole powder pattern modeling, a recently proposed method for the study of line broadening. The main result in this typical case of study—the crystalline domain size distribution—matches closely the corresponding information obtained by transmission electron microscopy. Further information on nature and content of lattice defects is also discussed.

The growth temperature dependence of the InN film’s crystalline quality is reported. InN films are grown on sapphire substrates from 570 to 650 °C with low-temperature GaN buffers by metalorganic vapor phase epitaxy (MOVPE). The X-ray rocking curves and reciprocal space mappings of the symmetric reflection (0 0 0 2) and asymmetric reflection (1 0 1 2) are measured with high resolution X-ray diffraction. The results indicate that the crystallinity is sensitive to the growth temperature for MOVPE InN. At growth temperature 580 °C, highly crystalline InN film has been obtained, for which the full-width-at-half-maxima of (0 0 0 2) and (1 0 1 2) rocking curves are 24 and 28 arcmin, respectively. The crystalline quality deteriorates drastically when the growth temperature exceeds 600 °C. Combined with the carrier concentration and mobility, the approach to improve the quality of InN film by MOVPE is discussed.