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Optimizing the cleanliness in multi-segment disk amplifiers based on vector flow schemes

Published online by Cambridge University Press:  24 January 2018

Zhiyuan Ren*
Affiliation:
Key Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Jianqiang Zhu
Affiliation:
Key Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Zhigang Liu
Affiliation:
Key Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Xiaowei Yang
Affiliation:
Key Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
*
Correspondence to: Zhiyuan Ren. 390 Qinghe Road, Jiading District, Shanghai 201800, China. Email: renzhiyuan@siom.ac.cn

Abstract

The objective of maintaining the cleanliness of the multi-segment disk amplifier in Shenguang-II (SG-II) is to reduce laser-induced damage for optics. The flow field of clean gas, which is used for the transportation of contaminant particles, is a key factor affecting the cleanliness level in the multi-segment disk amplifier. We developed a gas–solid coupling and three-dimensional flow numerical simulation model. The three-dimensional and two-phase flow model is verified by the flow-field smog experiment and the particle concentration measurement experiment with the 130-disk amplifier in SG-II. By optimizing the boundary conditions with the same flow rate, the multi-inlet vector flow scheme can not only effectively reduce the purging time, but also prevent the reverse diffusion of contaminant particles in the multi-segment disk amplifier and the deposition of contaminant particles on the surface of the Nd:glass.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
© The Author(s) 2018
Figure 0

Figure 1. The configuration of the 130-disk amplifier.

Figure 1

Figure 2. Flow field of the cavity of the 130-disk amplifier: (a) numerical simulation result; (b) experimental result.

Figure 2

Figure 3. Concentration change of contaminant particles with time in the 130-disk amplifier.

Figure 3

Figure 4. Current configuration of inlets and outlets for the multi-segment disk amplifier. (a) Configuration of the multi-segment disk amplifier. (b) Simulation model of the multi-segment disk amplifier.

Figure 4

Figure 5. Flow field of the current multi-segment disk amplifier: (a) velocity distribution in the cavity; (b) streamline in the cavity; (c) velocity distribution on the surface of Nd:glass; (d) streamline on the surface of Nd:glass.

Figure 5

Figure 6. Optimized configuration of inlets and outlets of the amplifier.

Figure 6

Figure 7. Flow field of the multi-segment disk amplifier with the vector flow scheme: (a) velocity distribution in the cavity; (b) streamline in the cavity; (c) velocity distribution on the surface of Nd:glass; (d) streamline on the surface of Nd:glass.