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Automated bench test for UHF RFID tags measurement in operational environment

Published online by Cambridge University Press:  13 May 2011

Audrey Pouzin ,
Tan-Phu Vuong ,
Smaïl Tedjini  and
Jacques Perdereau
Audrey Pouzin*
Affiliation:
LCIS, Grenoble Institute of Technology, Valence, 26000, France. Phone: + 33 67036 4227. National Laboratory of Metrology and Testing, Trappes 78197, France.
Tan-Phu Vuong
Affiliation:
IMEP-LAHC, Grenoble Institute of Technology, Grenoble 38000, France.
Smaïl Tedjini
Affiliation:
LCIS, Grenoble Institute of Technology, Valence, 26000, France. Phone: + 33 67036 4227.
Jacques Perdereau
Affiliation:
National Laboratory of Metrology and Testing, Trappes 78197, France.
*
Corresponding author: A. Pouzin Email: Audrey.pouzin@9online.fr
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Abstract

This paper synthesizes protocol measurements for Ultra High Frequency (UHF) radiofrequency identification (RFID) tags’ performance. We introduce the main parameters allowing the evaluation of an inlay tag performances. We characterize all devices implemented on the test bench. We explain the different programs and all methods used for the software automation. Finally, we studied the variation of the measured parameters as a function of power, frequency, or tag orientation, both in free space and in disturbed environment through our automated test bench

Keywords

AutomationBench testMeasurementOperational environmentRFID tags

Information

Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 3 , Issue 4 , August 2011 , pp. 415 - 422
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2011

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References

REFERENCES

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