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A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz

Published online by Cambridge University Press:  30 March 2015

Armin Talai ,
Frank Steinhäußer ,
Achim Bittner ,
Ulrich Schmid ,
Robert Weigel  and
Alexander Koelpin Open the ORCID record for Alexander Koelpin [Opens in a new window]
Armin Talai*
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-University, Cauerstraße 9, D-91058 Erlangen, Germany. Phone: + 49 9131 8528847
Frank Steinhäußer
Affiliation:
Institute of Sensor and Actuator Systems, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
Achim Bittner
Affiliation:
Institute of Sensor and Actuator Systems, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
Ulrich Schmid
Affiliation:
Institute of Sensor and Actuator Systems, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
Robert Weigel
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-University, Cauerstraße 9, D-91058 Erlangen, Germany. Phone: + 49 9131 8528847
Alexander Koelpin
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-University, Cauerstraße 9, D-91058 Erlangen, Germany. Phone: + 49 9131 8528847
*
Corresponding author: A. Talai Email: armin.talai@fau.de
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Abstract

An accurate characterization of microwave materials is essential for reliable high-frequency circuit design. This paper presents a measurement setup, which enables a quick and accurate determination of the relative permittivity of dielectric bulk materials up to 110 GHz. A ring-resonator is manufactured on a well-characterized substrate, serving as reference resonator. The material under test (MUT) is placed on top of the ring, which increases the effective permittivity and therefore introduces a shift of the resonance frequency of the resonator. In case of moderate to large dielectric losses of the MUTs, the quality factor of the resonator decreases perceptibly, which provides conclusions about the dielectric losses. Electromagnetic field simulations with different heights and relative permittivities of the MUTs provide a look-up table for the measured resonance frequencies. The functionality of the proposed measurement setup is validated by measurement results of different MUTs.

Keywords

Characterization of material parametersMicrowave measurements
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 7 , Special Issue 3-4: European Microwave Week 2014 , June 2015 , pp. 251 - 260
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2015 

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