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Quasi-optical modeling of a millimeter- and submillimeter-wave free-space characterization bench

Published online by Cambridge University Press:  11 February 2025

Gregory Gaudin Open the ORCID record for Gregory Gaudin [Opens in a new window] ,
Clément Henry ,
Daniel Bourreau  and
Alain Peden
Gregory Gaudin*
Affiliation:
Microwaves department, IMT Atlantique, Brest, France
Clément Henry
Affiliation:
Microwaves department, IMT Atlantique, Brest, France
Daniel Bourreau
Affiliation:
Microwaves department, IMT Atlantique, Brest, France
Alain Peden
Affiliation:
Microwaves department, IMT Atlantique, Brest, France
*
Corresponding author: Gregory Gaudin; Email: gregory.gaudin@imt-atlantique.fr
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Abstract

In this article, we present a simulation tool for modeling a quasi-optical bench for material characterization. The model uses a Gaussian beam expansion and tracking analysis, together with a modal analysis to enable a comparison of the simulated reflection and transmission S-parameters to the ones measured with a 4-port vector network analyzer. A Thru-Reflect-Line calibration is performed to de-embed the simulated S-parameters of a dielectric slab located between two lens antennas, showing good agreement with the analytical slab model used for experimental permittivity extraction.

Keywords

Gaussian beamsquasi-optical systemsmaterial characterization

Information

Type
Research Paper
Information
International Journal of Microwave and Wireless Technologies , Volume 17 , Special Issue 6: JNM 2024 , July 2025 , pp. 950 - 960
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Copyright
© The Author(s), 2025. Published by Cambridge University Press in association with The European Microwave Association.

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References

García Pérez, Ó, Tercero, F and Lopez Ruiz, S (2017) Free-space W-band setup for the electrical characterization of materials and mm-wave components. Technical report, Spain: Observatorio de Yebes Guadalajara.Google Scholar
Saenz, E, L, Rolo, K, Van’t Klooster, M, Paquay and VV, Parshin (2012) Accuracy assessment of material measurements with a quasi-optical free-space test bench. In 6th European Conference on Antennas and Propagation (EuCAP). 572–576. doi: 10.1109/EuCAP.2012.6206324CrossRefGoogle Scholar
Hammler, J, Gallant, A and Balocco, C (2016) Free-space permittivity measurement at terahertz frequencies with a vector network analyzer. IEEE Transactions on Terahertz Science and Technology 6, 10. doi: 10.1109/TTHZ.2016.2609204CrossRefGoogle Scholar
Simakov, EI, Choi, W, Zuboraj, M, Carlsten, BE and Choi, EM (2020) Error tolerant method of dielectric permittivity determination using a te01 mode in a circular waveguide at the W-band. IEEE Transactions on Microwave Theory and Techniques 68, 808–815. doi: 10.1109/TMTT.2019.2951156Google Scholar
Pantano, N, Slabbekoorn, J, Duval, F and Beyne, E (2021) Broadband permittivity characterization of polymers up to 110 GHz using co-planar waveguides. In 2021 IEEE 71st Electronic Components and Technology Conference (ECTC). 1252–1257. doi: 10.1109/ECTC32696.2021.00203CrossRefGoogle Scholar
Bourreau, D, Peden, A and Maguer, S (2007) A quasi-optical free-space measurement setup without time-domain gating for material characterization in the W-band. Instrumentation and Measurement, IEEE Transactions on 55, 2022–2028. doi: 10.1109/TIM.2006.884283CrossRefGoogle Scholar
Mrnka, M, Appleby, R and Saenz, E (2022) Accurate S-parameter modeling and material characterization in quasi-optical systems. IEEE Transactions on Terahertz Science and Technology 12, 199–210. doi: 10.1109/TTHZ.2021.3140201CrossRefGoogle Scholar
Gaudin, G, Bourreau, D, Henry, C and Peden, A (2024) Modelisation de systemes quasi-optiques deie a la caracteisation de mateiaux et a l’imagerie en bande J (220-330 GHz). In JNM 2024, France:Antibes Juan-Les-Pins. https://imt-atlantique.hal.science/hal-04631622Google Scholar
Bourreau, D and Péden, A (2021) Solid and non-solid dielectric material characterization for millimeter and sub-millimeter wave applications. In 2020 50th European Microwave Conference (EuMC). 909–912. doi: 10.23919/EuMC48046.2021.9338045CrossRefGoogle Scholar
Paul, FG (1998) Gaussian Beam Propagation. Quasioptical Systems: Gaussian Beam Quasioptical Propogation and Applications, Piscataway, New Jersey: Wiley-IEEE Press. 9–38. doi: 10.1109/9780470546291.ch2Google Scholar
Saleh, BEA (1991). In Beam Optics, Teich, MC, (ed), John Wiley & Sons, Ltd. 80–107. doi: 10.1002/0471213748.ch3Google Scholar
Chabory, A, Sokoloff, J, Bolioli, S and François Combes, P (2005) Computation of electromagnetic scattering by multilayer dielectric objects using Gaussian beam based techniques. 6, 654–662. doi: 10.1016/j.crhy.2005.06.011CrossRefGoogle Scholar
Chabory, A, Sokoloff, J and Bolioli, S (2008) Physically based expansion on conformal Gaussian beams for the radiation of curved aperture in dimension 2. Microwaves, Antennas & Propagation, IET 2, 152–157. doi: 10.1049/iet-map:20060168CrossRefGoogle Scholar
Kochkina, E, Wanner, G, Schmelzer, D, Tröbs, M and Heinzel, G (2013) Modeling of the general astigmatic Gaussian beam and its propagation through 3D optical systems. Applied Optics 52, 6030–6040. doi: 10.1364/AO.52.006030CrossRefGoogle ScholarPubMed
Rohani, A, Ahmad Shishegar, A and Safavi-Naeini, S (2004) A fast Gaussian beam tracing method for reflection and refraction of general vectorial astigmatic Gaussian beams from general curved surfaces. Optics Communications 232, 1–10. doi: 10.1016/j.optcom.2003.11.044CrossRefGoogle Scholar
Ruiz-Cruz, J, Montejo-Garai, J and Rebollar, J (2010) Computer aided design of waveguide devices by mode-matching methods. InTech 4, 117–140. doi: 10.5772/9403Google Scholar
Engen, GF and Hoer, CA (1979) Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer. IEEE Transactions on Microwave Theory and Techniques 27, 987–993. doi: 10.1109/TMTT.1979.1129778CrossRefGoogle Scholar
Geuzaine, C and Remacle, J-F (2009) Gmsh: A 3-D finite element mesh generator with built-in pre- and post-processing facilities. International Journal for Numerical Methods in Engineering 79, . doi: 10.1002/nme.2579CrossRefGoogle Scholar