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Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys

Published online by Cambridge University Press:  20 April 2015

Chad M. Parish
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, Tennessee 37831, USA
Kevin G. Field
Affiliation:
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, Tennessee 37831, USA
Janelle P. Wharry*
Affiliation:
Boise State University, Department of Materials Science & Engineering, Boise, ID 83725, USA
*
a)Address all correspondence to this author. e-mail: janellewharry@boisestate.edu
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Abstract

This paper provides an overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. Finally, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.

Type
Reviews
Copyright
Copyright © Materials Research Society 2015 

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Footnotes

b)

Previously at Pacific Northwest National Laboratory, Richland, Washington 99354, USA

Contributing Editor: Djamel Kaoumi

This section of Journal of Materials Research is reserved for papers that are reviews of literature in a given area.

References

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