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Application of STEM characterization for investigating radiation effects in BCC Fe-based alloys

Published online by Cambridge University Press:  20 April 2015

Chad M. Parish
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, Tennessee 37831, USA
Kevin G. Field
Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, Tennessee 37831, USA
Janelle P. Wharry*
Boise State University, Department of Materials Science & Engineering, Boise, ID 83725, USA
a)Address all correspondence to this author. e-mail:
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This paper provides an overview of advanced scanning transmission electron microscopy (STEM) techniques used for characterization of irradiated BCC Fe-based alloys. Advanced STEM methods provide the high-resolution imaging and chemical analysis necessary to understand the irradiation response of BCC Fe-based alloys. The use of STEM with energy dispersive x-ray spectroscopy (EDX) for measurement of radiation-induced segregation (RIS) is described, with an illustrated example of RIS in proton- and self-ion irradiated T91. Aberration-corrected STEM-EDX for nanocluster/nanoparticle imaging and chemical analysis is also discussed, and examples are provided from ion-irradiated oxide dispersion strengthened (ODS) alloys. Finally, STEM techniques for void, cavity, and dislocation loop imaging are described, with examples from various BCC Fe-based alloys.

Copyright © Materials Research Society 2015 

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Previously at Pacific Northwest National Laboratory, Richland, Washington 99354, USA

Contributing Editor: Djamel Kaoumi

This section of Journal of Materials Research is reserved for papers that are reviews of literature in a given area.



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