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Bi-epitaxial grain boundaries in YBa2Cu3O7−x thin films prepared by pulsed laser deposition and pulsed organometallic beam epitaxy: Direct comparison of transport properties and grain boundary structure

Published online by Cambridge University Press:  31 January 2011

Boris Vuchic ,
K. L. Merkle ,
K. Char ,
D. B. Buchholz ,
R. P. H. Chang  and
L. D. Marks
Boris Vuchic
Affiliation:
Materials Science Division and Science and Technology Center for Superconductivity, Argonne National Laboratory, Argonne, Illinois 60439
K. L. Merkle
Affiliation:
Materials Science Division and Science and Technology Center for Superconductivity, Argonne National Laboratory, Argonne, Illinois 60439
K. Char
Affiliation:
Conductus, Inc., 969 West Maude Avenue, Sunnyvale, California 94086
D. B. Buchholz
Affiliation:
Materials Science and Engineering Department, Northwestern University, Evanston, Illinois 60208
R. P. H. Chang
Affiliation:
Materials Science and Engineering Department, Northwestern University, Evanston, Illinois 60208
L. D. Marks
Affiliation:
Materials Science and Engineering Department, Northwestern University, Evanston, Illinois 60208
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Abstract

A set of 45° [001] bi-epitaxial YB2Cu3O7−x thin film grain boundaries was studied to compare the effects of the microstructure on transport properties. The grain boundaries were made using two different deposition techniques: pulsed laser deposition (PLD) and pulsed organometallic beam epitaxy (POMBE). The transport properties were highly dependent on the specific growth conditions used, resulting in both fully resistive and superconducting grain boundaries. Subsequent microstructural analysis of the measured boundaries showed that both types (superconducting and resistive) meandered on the length scale of hundreds of nanometers. The major structural difference between the boundaries was at the atomic scale where the resistive boundary had a 1 nm wide disordered region. The direct correlation of microstructure to transport properties demonstrates the importance of the atomic scale structure in the resulting transport behavior.

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Articles
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Journal of Materials Research , Volume 11 , Issue 10 , October 1996 , pp. 2429 - 2439
Copyright
Copyright © Materials Research Society 1996

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References

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