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Development of a reliable materials base for superconducting electronics

Published online by Cambridge University Press:  31 January 2011

JiPing Zhou ,
Rung-Kuang Lo ,
John T. McDevitt ,
John Talvacchio ,
Martin G. Forrester ,
Brian D. Hunt ,
Q. X. Jia  and
D. Reagor
JiPing Zhou
Affiliation:
Department of Chemistry and Biochemistry, University of Texas at Austin, Austin, Texas 78712
Rung-Kuang Lo
Affiliation:
Department of Chemistry and Biochemistry, University of Texas at Austin, Austin, Texas 78712
John T. McDevitt*
Affiliation:
Department of Chemistry and Biochemistry, University of Texas at Austin, Austin, Texas 78712
John Talvacchio
Affiliation:
Northrop Grumman Science and Technology Center, Pittsburgh, Pennsylvania 15235
Martin G. Forrester
Affiliation:
Northrop Grumman Science and Technology Center, Pittsburgh, Pennsylvania 15235
Brian D. Hunt
Affiliation:
Northrop Grumman Science and Technology Center, Pittsburgh, Pennsylvania 15235
Q. X. Jia
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
D. Reagor
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
*
b)Author to whom correspondence should be addressed.
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Abstract

Careful studies of the corrosion, redox, galvanic, and oxygen evolution/uptake reactions associated with YBa2Cu3O7–δ and related compounds have been completed. These studies have led to an understanding of the many factors that contribute to the poor material characteristics exhibited by these popular high-Tc phases. With knowledge of the structure-reactivity relationships, a powerful crystal engineering approach has been developed that is capable of producing cation substituted versions of YBa2Cu3O7–δ; the resulting compounds therefrom produced exhibit markedly improved processability, oxygen stability, and durability characteristics. These materials have been combined in thin film structures so as to make prototype SNS junctions and SQUID sensors which exhibit promising device performance characteristics.

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Articles
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Journal of Materials Research , Volume 12 , Issue 11 , November 1997 , pp. 2958 - 2975
Copyright
Copyright © Materials Research Society 1997

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