Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Huang, Chien-Sheng
Jang, Guh-Yaw
and
Duh, Jeng-Gong
2003.
Interfacial reactions and compound formation in the edge of PbSn flip-chip solder bumps on Ni/Cu under-bump metallization.
Journal of Electronic Materials,
Vol. 32,
Issue. 11,
p.
1273.
Cheng, Shou Chang
and
Lin, Kwang Lung
2003.
Interfacial evolution between Cu and Pb–free Sn–Zn–Ag–Al solders upon aging at 150 °C.
Journal of Materials Research,
Vol. 18,
Issue. 8,
p.
1795.
Yoon, Seung Wook
Kim, Jong Hoon
Jeong, Sang Won
and
Lee, Hyuck Mo
2003.
Effect of Under Bump Metallurgy and Reflows on Shear Strength and Microstructure of Joint between Cu Substrate and Sn-36Pb-2Ag Solder Alloy.
MATERIALS TRANSACTIONS,
Vol. 44,
Issue. 2,
p.
290.
Pang, J.H.L.
Prakash, K.H.
and
Low, T.H.
2004.
Isothermal and thermal cycling aging on IMC growth rate in Pb-free and Pb-based solder interfaces.
p.
109.
Jeong, Sang Won
Kim, Jong Hoon
and
Lee, Hyuck Mo
2004.
Effect of cooling rate on growth of the intermetallic compound and fracture mode of near-eutectic Sn-Ag-Cu/Cu pad: Before and after aging.
Journal of Electronic Materials,
Vol. 33,
Issue. 12,
p.
1530.
Qiang Hu
Zhong-suo Lee
Zhi-li Zhao
and
Da-le Lee
2005.
Study of cooling rate on lead-free soldering microstructure of Sn-3.0Ag-0.5Cu solder.
p.
156.
Luhua Xu
Pang, J.H.L.
and
Che, F.X.
2005.
Intermetallic Growth and Failure Study for Sn-Ag-Cu/ENIG PBGA Solder Joints Subject to Thermal Cycling.
Vol. 2,
Issue. ,
p.
682.
Tsai, S.
Lee, C.
Chiou, G.
and
Duh, J.
2005.
Elemental Redistribution and Diffusion Path Configuration Near the Edge of Sn-95Pb Solder Bump/Ni-Cu UBM Joints after Aging in the Flip-Chip Technology.
p.
1.
Luhua Xu
Pang, J.H.L.
Prakash, K.H.
and
Low, T.H.
2005.
Isothermal and thermal cycling aging on IMC growth rate in lead-free and lead-based solder interface.
IEEE Transactions on Components and Packaging Technologies,
Vol. 28,
Issue. 3,
p.
408.
Luhua Xu
Pang, J.H.L.
and
Faxing Che
2005.
Failure Study of Sn-Ag-Cu Lead-free Solder Joint by Digital Image Speckle Analysis (DISA).
Vol. 1,
Issue. ,
p.
125.
Lee, Hsiang-Yi
and
Duh, Jenq-Gong
2006.
Influence of Ni concentration and Ni3Sn4 nanoparticles on morphology of Sn-Ag-Ni solders by mechanical alloying.
Journal of Electronic Materials,
Vol. 35,
Issue. 3,
p.
494.
Chen, H.T.
Wang, C.Q.
and
Li, M.Y.
2006.
Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling.
Microelectronics Reliability,
Vol. 46,
Issue. 8,
p.
1348.
Chen, H.T.
Wang, C.Q.
Li, M.Y.
and
Tian, D.W.
2006.
Effect of Cu diffusion through Ni on the interfacial reactions of Sn3.5Ag0.75Cu and SnPb solders with Au/Ni/Cu substrate during aging.
Materials Letters,
Vol. 60,
Issue. 13-14,
p.
1669.
Hsiao, Li-Yin
Chiou, Guo-Jyun
Duh, Jenq-Gong
and
Tsai, Su-Yueh
2006.
Synthesis and Application of Novel Lead-Free Solders Derived from Sn-based Nanopowders.
p.
1.
HAN, H.
SOHN, Y. C.
and
YU, JIN
2007.
Interfacial Reactions between Cu x Ni y Alloy Underbump Metallurgy and Sn-Ag-zCu Solders.
Journal of Electronic Materials,
Vol. 36,
Issue. 5,
p.
578.
Kim, J.Y.
Sohn, Y.C.
and
Yu, Jin
2007.
Effect of Cu content on the mechanical reliability of Ni/Sn–3.5Ag system.
Journal of Materials Research,
Vol. 22,
Issue. 3,
p.
770.
Lee, Yang-Hsien
and
Lee, Hwa-Teng
2007.
Shear strength and interfacial microstructure of Sn–Ag–xNi/Cu single shear lap solder joints.
Materials Science and Engineering: A,
Vol. 444,
Issue. 1-2,
p.
75.
Kang, Sung K.
Moon Gi Cho
Da-Yuan Shih
Sun-Kyoung Seo
and
Hyuck Mo Lee
2008.
Controlling the interfacial reactions in Pb-free interconnections by adding minor alloying elements to Sn-rich solders.
p.
478.
Wan, Jing Bo
Liu, Yong Chang
Wei, Chen
Jiang, Peng
and
Gao, Zhi Ming
2008.
Effect of the soldering time on the formation of interfacial structure between Sn–Ag–Zn lead-free solder and Cu substrate.
Journal of Materials Science: Materials in Electronics,
Vol. 19,
Issue. 12,
p.
1160.
Bali, R.
Fleury, E.
Han, S.H.
and
Ahn, J.P.
2008.
Interfacial intermetallic phases and nanoeutectic in rapidly quenched Sn–Ag–Cu on Au under bump metallization.
Journal of Alloys and Compounds,
Vol. 457,
Issue. 1-2,
p.
113.