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Measurement of residual stress by load and depth sensing indentation with spherical indenters

Published online by Cambridge University Press:  31 January 2011

J. G. Swadener ,
B. Taljat  and
G.M. Pharr
J. G. Swadener
Affiliation:
Oak Ridge National Laboratory, Metals and Ceramics Division, P.O. Box 2008, MS-6093, Oak Ridge, Tennessee 37831–6093, and the University of Tennessee, Department of Materials Science and Engineering, Knoxville,Tennessee 37996–2200
B. Taljat
Affiliation:
STEEL Group 31054 Motto di Livenza, Travois, Italy, and Faculty of Mechanical Engineering, University of Ljubljana, Slovenia
G.M. Pharr
Affiliation:
Oak Ridge National Laboratory, Metals and Ceramics Division, P.O. Box 2008, MS-6093, Oak Ridge, Tennessee 37831–6093, and the University of Tennessee, Department of Materials Science and Engineering, Knoxville, Tennessee 37996–2200
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Abstract

A new experimental technique is presented for making measurements of biaxial residual stress using load and depth sensing indentation (nanoindentation). The technique is based on spherical indentation, which, in certain deformation regimes, can be much more sensitive to residual stress than indentation with sharp pyramidal indenters like the Berkovich. Two different methods of analysis were developed: one requiring an independent measure of the material's yield strength and the other a reference specimen in the unstressed state or other known reference condition. Experiments conducted on aluminum alloys to which controlled biaxial bending stresses were applied showed that the methods are capable of measuring the residual stress to within 10–20% of the specimen yield stress. Because the methods do not require imaging of the hardness impressions, they are potentially useful for making localized measurements of residual stress, as in thin films or small volumes, or for characterization of point-to-point spatial variations of the surface stress.

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Type
Articles
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Journal of Materials Research , Volume 16 , Issue 7 , July 2001 , pp. 2091 - 2102
Copyright
Copyright © Materials Research Society 2001

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