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Crystallization of various compositions in the Y2O3–SiO2 system

  • Suresh Kumar (a1) and Charles H. Drummond (a1)

In as-sintered silicon nitride with yttria as a sintering aid, the intergranular glassy phase contains Y, Si, O, and N. Results of crystallization of partly crystalline, as-quenched melt samples containing 28–40 mol% Y2O3 in the Y2O3–SiO2 system are presented. Three different compositions were melted in tungsten crucibles at 2100 °C in 1 and 50 atm nitrogen and heat treated in air in the temperature range of 1200 to 1600 °C. Phase identification by x-ray diffraction (XRD) and transmission electron microscopy (TEM) showed crystallization to β, γ, and δ polymorphs of Y2Si2O7.

Corresponding author
a)Present address: #120 Steidle Building, Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802.
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Journal of Materials Research
  • ISSN: 0884-2914
  • EISSN: 2044-5326
  • URL: /core/journals/journal-of-materials-research
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