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Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy

  • Wenge Yang (a1), B.C. Larson (a1), G.M. Pharr (a2), G.E. Ice (a1), J.D. Budai (a1), J.Z. Tischler (a1) and Wenjun Liu (a1)
  • DOI:
  • Published online: 01 March 2011

The use of three-dimensional x-ray structural microscopy for nondestructive investigations of the deformation microstructure under microindents was demonstrated. Point to point, micrometer-resolution x-ray microbeam measurements of local lattice rotations were made for selected positions under 100-mN Berkovich and conical indents in single-crystal copper. Local lattice orientation measurements were used to extract micrometer by micrometer lattice misorientations and rotation axes along x-ray microbeams. Measurements of the deformation microstructure in symmetry and off-symmetry geometries are reported and discussed in terms of their potential for fundamental deformation investigations.

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Journal of Materials Research
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