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Effect of experimental parameters and (Fe, Ni) doping on the structural, morphological, and optical properties of sol–gel dip-coated SnO2 films

Published online by Cambridge University Press:  17 April 2017

Salima Benkara ,
Houda Ghamri ,
Djamil Rechem  and
Mourad Zaabat
Salima Benkara*
Affiliation:
Laboratory of Active Components and Materials, Larbi Ben M'Hidi University, Oum El Bouaghi 04000, Algeria; and Electrical Engineering Department, Larbi Ben M’hidi University, Oum El Bouaghi 04000, Algeria
Houda Ghamri
Affiliation:
Physic Department, Hadj Lakhdar University, Batna 05000, Algeria
Djamil Rechem
Affiliation:
Laboratory of Active Components and Materials, Larbi Ben M'Hidi University, Oum El Bouaghi 04000, Algeria; and Electrical Engineering Department, Larbi Ben M’hidi University, Oum El Bouaghi 04000, Algeria
Mourad Zaabat
Affiliation:
Laboratory of Active Components and Materials, Larbi Ben M'Hidi University, Oum El Bouaghi 04000, Algeria
*
a) Address all correspondence to this author. e-mail: benkaras03@yahoo.fr
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Abstract

A pure and (Fe–Ni) doped tin oxide thin films were formed on glass substrates by sol–gel dip coating method. Some characterization techniques are used as X-ray diffraction (XRD), UV–vis spectroscopy and atomic force microscopy (AFM) to study the effect of method conditions and dopants on the structural, morphological, and optical properties of thin films. According to XRD results, no phase attributed to Fe or Ni were detected, which suggests the incorporation of Fe and Ni in SnO2 network. All the diffraction peaks can be assigned as rutile phase of pure SnO2 except (111) is attributed to cubic phase. The optic analyses have shown an average transmittance between 70 and 90%, and showed a direct band gap reducing with increase in Fe doping (3.82–3.72 eV) and Ni content (3.82–3.69 eV). AFM images have revealed that surface roughness is affected strongly by deposition conditions and dopant contents.

Keywords

tin oxideFe doped SnO2sol–gel growthUV–visible spectroscopydip-coating

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Type
Articles
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Journal of Materials Research , Volume 32 , Issue 8 , 28 April 2017 , pp. 1594 - 1602
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Copyright
Copyright © Materials Research Society 2017 

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Footnotes

Contributing Editor: Winston V. Schoenfeld

References

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