Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Cahn, Robert W.
1992.
Metallic solid silicon.
Nature,
Vol. 357,
Issue. 6380,
p.
645.
Juan, Yu-Min
and
Kaxiras, Efthimios
1993.
High-pressure plastic flow in silicon: A first-principles theoretical study.
Journal of Computer-Aided Materials Design,
Vol. 1,
Issue. 1,
p.
55.
Brotzen, F. R.
1994.
Mechanical testing of thin films.
International Materials Reviews,
Vol. 39,
Issue. 1,
p.
24.
Nowak, R.
and
Sakai, M.
1994.
The anisotropy of surface deformation of sapphire: Continuous indentation of triangular indenter.
Acta Metallurgica et Materialia,
Vol. 42,
Issue. 8,
p.
2879.
Brotzen, F. R.
1994.
Mechanical testing of thin films.
International Materials Reviews,
Vol. 39,
Issue. 1,
p.
24.
Nowak, R.
1995.
Plastic Deformation of Ceramics.
p.
149.
Hainsworth, Sarah V.
Whitehead, Andrew J.
and
Page, Trevor F.
1995.
Plastic Deformation of Ceramics.
p.
173.
CAHN, R.W.
and
GREER, A.L.
1996.
Physical Metallurgy.
p.
1723.
Gogotsi, Y.G.
Kailer, A.
and
Nickel, K.G.
1997.
Phase transformations in materials studied by micro-Raman spectroscopy of indentations.
Materials Research Innovations,
Vol. 1,
Issue. 1,
p.
3.
Lucazeau, G.
and
Abello, L.
1997.
Micro-Raman analysis of residual stresses and phase transformations in crystalline silicon under microindentation.
Journal of Materials Research,
Vol. 12,
Issue. 9,
p.
2262.
Page, T. F.
Riester, L.
and
Hainsworth, S. V.
1998.
The Plasticity Response Of 6H-Sic and Related Isostructural Materials to Nanoindentation: Slip vs Densification.
MRS Proceedings,
Vol. 522,
Issue. ,
Farber, B. Ya.
Orlov, V. I.
Nikitenko, V. I.
and
Heuer, A. H.
1998.
Mechanisms of energy dissipation during displacement- sensitive indentation in Ge single crystals at elevated temperatures.
Philosophical Magazine A,
Vol. 78,
Issue. 3,
p.
671.
Gogotsi, Yury
Rosenberg, Michael S.
Kailer, Andreas
and
Nickel, Klaus G.
1998.
Tribology Issues and Opportunities in MEMS.
p.
431.
Gogotsi, Y
Baek, C
and
Kirscht, F
1999.
Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon.
Semiconductor Science and Technology,
Vol. 14,
Issue. 10,
p.
936.
Nowak, R.
Pessa, M.
Suganuma, M.
Leszczynski, M.
Grzegory, I.
Porowski, S.
and
Yoshida, F.
1999.
Elastic and plastic properties of GaN determined by nano-indentation of bulk crystal.
Applied Physics Letters,
Vol. 75,
Issue. 14,
p.
2070.
Kailer, Andreas
Nickel, Klaus G.
and
Gogotsi, Yury G.
1999.
Raman microspectroscopy of nanocrystalline and amorphous phases in hardness indentations.
Journal of Raman Spectroscopy,
Vol. 30,
Issue. 10,
p.
939.
Domnich, Vladislav
Gogotsi, Yury
and
Trenary, Michael
2000.
Identification of Pressure-Induced Phase Transformations Using Nanoindentation.
MRS Proceedings,
Vol. 649,
Issue. ,
Dub, Sergey N.
Milman, Yuly V.
Lozko, Dina V.
and
Belous, Anton N.
2000.
Mechanism of Al-Cu-Fe Quasicrystal Plastic Deformation Studied by Instrumented Sharp Indentation.
MRS Proceedings,
Vol. 649,
Issue. ,
Gogotsi, Yury G.
Domnich, Vladislav
Dub, Sergey N.
Kailer, Andreas
and
Nickel, Klaus G.
2000.
Cyclic Nanoindentation and Raman Microspectroscopy Study of Phase Transformations in Semiconductors.
Journal of Materials Research,
Vol. 15,
Issue. 4,
p.
871.
Domnich, Vladislav
Gogotsi, Yury
and
Dub, Sergey
2000.
Effect of phase transformations on the shape of the unloading curve in the nanoindentation of silicon.
Applied Physics Letters,
Vol. 76,
Issue. 16,
p.
2214.