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Ion beam mixing study on Cu/Al2O3 bilayer samples using Rutherford backscattering spectrometry

Published online by Cambridge University Press:  03 March 2011

A.G. Balogh ,
M-P. Macht  and
V. Naundorf
A.G. Balogh
Affiliation:
Hann-Meitner-Institut, Berlin, Germany
M-P. Macht
Affiliation:
Hann-Meitner-Institut, Berlin, Germany
V. Naundorf
Affiliation:
Hann-Meitner-Institut, Berlin, Germany
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Abstract

Cu/Al2O3 bilayer samples were produced by vapor deposition and irradiated successively with 150 keV Ar ions up to a dose of 500 dpa. Ion beam mixing effects were studied by 2 Me V He+ Rutherford backscattering spectroscopy (RBS). Concentration depth profiles show the mixing of Cu, Al, and O atoms in the sample. Because of the low mixing efficiency found in this study, Al2O3-dispersion strengthened Cu alloys seem to be good candidates as structural materials in fusion reactors.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 2 , February 1994 , pp. 406 - 409
Copyright
Copyright © Materials Research Society 1994

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References

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