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Microstructure and morphology of surface oxide films on Ti–6A1–4V

  • M. Ask (a1), U. Rolander (a1), J. Lausmaa (a1) and B. Kasemo (a1)
Abstract

The microstructure of anodic oxide films grown on Ti–6A1–4V in H2SO4 was investigated by SEM, TEM, STEM, EDX, and AES, as a complement to a recent surface spectroscopic investigation of the same oxides by XPS, AES, and SIMS. The anodic oxide films are heterogeneous and the texture reflects the duplex microstructure (α and β phases) of the underlying metal. Porous oxide regions are observed with different appearances on α-phase and mixed-phase regions. The oxide films are essentially amorphous in the investigated thickness range 60–300 nm (in contrast to as-grown anodic films on pure Ti), but crystallize to the anatase structure upon annealing. Considerable lateral variation of the V content in the oxide is observed, reflecting the corresponding variation in the underlying metal. The results are compared with a previous, similar investigation of anodic oxides on pure Ti.

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Journal of Materials Research
  • ISSN: 0884-2914
  • EISSN: 2044-5326
  • URL: /core/journals/journal-of-materials-research
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