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Microstructure and superconducting properties of Y–Ba–Cu–O and Yb–Ba–Cu–O thin films formed by metalorganic deposition

Published online by Cambridge University Press:  31 January 2011

Y. L. Chen ,
J. V. Mantese ,
A. H. Hamdi  and
A. L. Micheli
Y. L. Chen
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
J. V. Mantese
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
A. H. Hamdi
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
A. L. Micheli
Affiliation:
General Motors Research Laboratories, Warren, Michigan 48090–9055
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Abstract

Thin films of Y–Ba–Cu–O and Yb–Ba–Cu–O, 0.5–1.5 μm in thickness, were deposited onto (211) and (100) SrTiO3 single crystal substrates by metalorganic deposition (MOD). After deposition the samples were annealed either by conventional furnace annealing or rapid thermal annealing (RTA). The microstructures of these films were then characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive x-ray spectrometry (EDS). Grain size of the annealed films varied from 0.25 to 1.0 μm. Improved superconducting properties were found for the RTA samples, compared to furnace annealing, and were attributed to larger grain size, little strontium diffusion into the thin films from the substrate, and highly preferred orientation of the 1:2:3 phase.

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Journal of Materials Research , Volume 4 , Issue 5 , October 1989 , pp. 1065 - 1071
Copyright
Copyright © Materials Research Society 1989

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References

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