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Mixing in PCBM/P3HT bilayers, using in situ and ex situ neutron reflectivity

  • Dyfrig Môn (a1), Anthony M. Higgins (a1), Philipp Gutfreund (a2) and David James (a1)

In situ and ex situ neutron reflectivity is used to characterize annealed regioregular-P3HT/PCBM bilayers. In situ annealing of a 20 nm PCBM/35 nm P3HT bilayer at 170 °C reveals rapid mixing of PCBM and P3HT to produce a polymer-rich layer that contains around 18–20% PCBM. Samples with three different thicknesses of P3HT layer are ex situ annealed at 140 °C. This again reveals migration of PCBM into the P3HT and vice versa, with the polymer-rich layer in the 20 nm PCBM/35 nm P3HT sample containing 19% PCBM. Complete migration of the entire PCBM layer into the P3HT layer is observed for a 20 nm PCBM/80 nm P3HT bilayer. The robustness of fitted model composition profiles, in comparison with real-space imaging of sample surface morphology and previous work on annealed P3HT/PCBM bilayer compositions, is discussed in detail.

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