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Refractive index profile and attenuation measurement in KTiOPO4 waveguide by megaelectronvolt He ions

Published online by Cambridge University Press:  31 January 2011

Ke-Ming Wang ,
Hiu Hu ,
Fei Lu ,
Feng Chen ,
Bo-Rong Shi ,
Yao-Gang Liu ,
Ding-Yu Shen  and
Xie-Mei Wang
Ke-Ming Wang
Affiliation:
Department of Physics, Shandong University, Jinan 250100, Shandong, People's Republic of China
Hiu Hu
Affiliation:
Department of Physics, Shandong University, Jinan 250100, Shandong, People's Republic of China
Fei Lu
Affiliation:
Department of Physics, Shandong University, Jinan 250100, Shandong, People's Republic of China
Feng Chen
Affiliation:
Department of Physics, Shandong University, Jinan 250100, Shandong, People's Republic of China
Bo-Rong Shi
Affiliation:
Department of Physics, Shandong University, Jinan 250100, Shandong, People's Republic of China
Yao-Gang Liu
Affiliation:
Institute of Crystal Materials, Shandong University, Jinan 250100, Shandong, People's Republic of China
Ding-Yu Shen
Affiliation:
MOE Laboratory of Heavy Ion Physics, Peking University, Beijing 100871, People's Republic of China
Xie-Mei Wang
Affiliation:
MOE Laboratory of Heavy Ion Physics, Peking University, Beijing 100871, People's Republic of China
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Abstract

An optically polished x-cut KTiOPO4 crystal of size 22×6×1.5mm3 was implanted with 2.8-MeV He ions to a dose of 1.5 × 1016 ions/cm2 at room temperature to form a waveguide. The prism coupling method was used to measure the modes and the fiber probe technique was used to measure the attenuation in the KTiOPO4 waveguide. The refractive index profile, nz, in the KTiOPO4 waveguide was given based on the procedure by Chandler and Lama [P.J. Chandler and F.L. Lama, Optica Acta 33, 123 (1986)]. The waveguide attenuation measured was 2.57 dB/cm for m = 1 mode. After annealing at 260 °C for 30 min, there was no obvious change in the KTiOPO4 waveguide attenuation.

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Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 1 , January 2001 , pp. 276 - 279
Copyright
Copyright © Materials Research Society 2001

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References

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