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Strain relaxation defects in perovskite oxide superlattices

  • Meng Gu (a1), Michael D. Biegalski (a2), Hans M. Christen (a2), Chengyu Song (a3), Craig R. Dearden (a4), Nigel D. Browning (a5) and Yayoi Takamura (a6)
  • DOI: http://dx.doi.org/10.1557/jmr.2012.42
  • Published online: 19 March 2012
Abstract
Abstract

This paper reports on the defect structures formed upon strain relaxation in pulsed laser-deposited complex oxide superlattices consisting of the ferromagnetic metal, La0.67Sr0.33MnO3, and the antiferromagnetic insulator, La0.67Sr0.33FeO3. Atomic resolution scanning transmission electron microscopy and electron energy loss spectroscopy were used to characterize the structure and chemistry of the defects. For thinner superlattices, strain relaxation occurs through the formation of 2-D stacking faults, whereas for thicker superlattices, the prolonged thermal exposure during film growth leads to the formation of nanoflowers and cracks/pinholes to reduce the overall strain energy.

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b)Address all correspondence to this author. e-mail: ytakamura@ucdavis.edu
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