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Thermal diffusivity of (Ca1–xSrx)3Co4O9 thin films using transient grating configuration

Published online by Cambridge University Press:  03 March 2011

Yoshiaki Takata ,
Yutaka Adachi ,
Hajime Haneda ,
Yoshiki Wada ,
Takefumi Mitsuhashi ,
Kenji Itaka  and
Hideomi Koinuma
Yoshiaki Takata*
Affiliation:
Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba-shi, Ibaraki 305-0044, Japan
Yutaka Adachi
Affiliation:
Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba-shi, Ibaraki 305-0044, Japan
Hajime Haneda
Affiliation:
Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba-shi, Ibaraki 305-0044, Japan
Yoshiki Wada
Affiliation:
Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba-shi, Ibaraki 305-0044, Japan
Takefumi Mitsuhashi
Affiliation:
Advanced Materials Laboratory, National Institute for Materials Science, 1-1 Namiki, Tsukuba-shi, Ibaraki 305-0044, Japan
Kenji Itaka
Affiliation:
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan
Hideomi Koinuma
Affiliation:
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan
*
a)Address all correspondence to this author. e-mail: takata.yoshiaki@nims.go.jp
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Abstract

The past impossibility to create optical diffraction fringe image out of transparent TiO2(100) substrate was overcome by pumping light pulse of 266-nm wavelength. Thermal diffusivities (D) of TiO2(100) substrate and (Ca1–xSrx)3Co4O9 (0 ≤ x ≤ 0.125) thin films can successfully be determined with a newly proposed transient grating configuration method arising from a generic nanoscale measurement technique. The D values obtained at room temperature were 0.04 cm2/s for the former and 0.07–0.12 cm2/s for the latter, respectively.

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Articles
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Journal of Materials Research , Volume 18 , Issue 10 , October 2003 , pp. 2473 - 2477
Copyright
Copyright © Materials Research Society 2003

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References

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