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X-ray photoelectron spectroscopy of electrodeposited cadmium mercury telluride thin films and their native surface oxides

Published online by Cambridge University Press:  31 January 2011

J. Ramiro ,
L. Galán ,
E. García Camarero ,
I. Montero  and
Y. Laaziz
J. Ramiro
Affiliation:
Departamento de Física Aplicada, Facultad de Ciencias, Universidad Autónoma de Madrid, 28049 Madrid, Spain
L. Galán
Affiliation:
Departamento de Física Aplicada, Facultad de Ciencias, Universidad Autónoma de Madrid, 28049 Madrid, Spain
E. García Camarero
Affiliation:
Departamento de Física Aplicada, Facultad de Ciencias, Universidad Autónoma de Madrid, 28049 Madrid, Spain
I. Montero
Affiliation:
Instituto de Ciencia de Materiales, CSIC, Campus de la Universidad Autónoma de Madrid, 28049 Madrid, Spain
Y. Laaziz
Affiliation:
L.P.S.C.M. Faculté des Sciences Semlalia, Dépt. Physique B.P.S./15, 40000 Marrakech, Morocco
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Abstract

Electrodeposited thin films of CdTe and CdxHg1−xTe with 1 − x = 0 and approximately 0.1 were characterized by x-ray photoelectron spectroscopy. The composition of the bulk and the thickness and composition of the native surface oxide before and after Ar+ ion sputtering were determined. A surface oxide layer 20-Å thick constituted mainly of alloyed TeO2 and CdO was found over a nearly stochiometric bulk. Chemical diffusion of Hg, Cd, and Te to the surface was observed. Hg appears to inhibit oxidation of the telluride, mainly of Te. Ar sputtering removed undesirable oxides and impurities off the films.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 7 , July 2001 , pp. 1942 - 1952
Copyright
Copyright © Materials Research Society 2001

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