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Thin film patterns classified by machine learning

By Sophia Chen July 22, 2019

MRS Bulletin Materials News Podcast

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Sophia Chen of MRS Bulletin interviews Alex Hexemer of Lawrence Berkeley National Laboratory in California, and Daniela Ushizima and Shuai Liu of the University of California, Berkeley about their design of multiple Convolutional Neural Networks (CNN) to classify nanoparticle orientation in a thin film by learning scattering patterns. Read the article in MRS Communications.