Hostname: page-component-89b8bd64d-46n74 Total loading time: 0 Render date: 2026-05-06T23:17:34.851Z Has data issue: false hasContentIssue false

On the rotational alignment of graphene domains grown on Ge(110) and Ge(111)

Published online by Cambridge University Press:  15 September 2015

P.C. Rogge*
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA 94720, USA Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
M.E. Foster
Affiliation:
Sandia National Laboratories, Livermore, CA 94550, USA
J.M. Wofford
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA 94720, USA Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
K.F. McCarty
Affiliation:
Sandia National Laboratories, Livermore, CA 94550, USA
N.C. Bartelt
Affiliation:
Sandia National Laboratories, Livermore, CA 94550, USA
O.D. Dubon
Affiliation:
Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA 94720, USA Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
*
Address all correspondence to P. C. Rogge atprogge@berkeley.edu

Abstract

We have used low-energy electron diffraction and microscopy to compare the growth of graphene on hydrogen-free Ge(111) and Ge(110) from an atomic carbon flux. Growth on Ge(110) leads to significantly better rotational alignment of graphene domains with the substrate. To explain the poor rotational alignment on Ge(111), we have investigated experimentally and theoretically how the adatom reconstructions of Ge interact with graphene. We find that the ordering transition of the Ge(111) adatom reconstruction is not significantly perturbed by graphene. Density functional theory calculations show that graphene on reconstructed Ge(110) has large-amplitude corrugations, whereas it is remarkably flat on reconstructed Ge(111). We argue that the absence of corrugations prevents graphene islands from locking into a preferred orientation.

Information

Type
Research Letters
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/3.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
Copyright © Materials Research Society 2015
Figure 0

Figure 1. (a) Initial Ge(111) surface after sputtering, field-of-view (FOV) = 25 µm, T = 25 °C. (b) LEED pattern of initial surface showing c(2 × 8) reconstruction, electron energy (“start voltage” or SV) = 19.9 eV. (c) Schematic of the c(2 × 8) reconstruction LEED pattern. (d) Ge surface after C deposition at 890 °C, FOV = 25 µm. (e) LEED pattern taken at T = 500 °C after C deposition showing first-order Ge(111) spots and a graphene diffraction ring, SV = 35.5 eV. (f) LEED pattern with smaller aperture showing distinct graphene diffraction spots, SV = 35.5 eV. (g) Intensity of the graphene LEED pattern extracted from (e) shows random and uniform variations with orientation.

Figure 1

Figure 2. (a) Low temperature LEED pattern showing the presence of both graphene and Ge(111) c(2 × 8) reconstruction, SV = 36.7 eV. (b) Comparison of the c(2 × 8) phase transition with temperature for pristine and graphene-covered Ge(111) by monitoring the 1/8th order c(2 × 8) reconstruction beams. (c) Comparison of the evolution of c(2 × 8) LEED spots with temperature for both pristine and graphene-covered Ge(111) compared at similar points through their respective changes in c(2 × 8) intensity, as determined by the intensity changes in (b) and denoted by the percentage value. (d), (e) Intensity profiles of 1/2 and 1/8-order c(2 × 8) LEED spots taken along the red, dashed lines in (c) and plotted together for pristine Ge(111) c(2 × 8) reconstruction (d) and the graphene-covered Ge surface (e) at various percentages of intensity change. 1/8-order intensity shifted in y-axis for clarity, scale is maintained.

Figure 2

Figure 3. (a) LEEM image of pristine Ge(110) surface; FOV = 15 µm. (b) LEED pattern of pristine surface. First-order spots highlighted by red circles, superstructure spots attributed to {17 15 1} facets; SV = 11.9 eV. (c) LEEM image after C deposition for 45 min at 870 °C; FOV = 15 µm. (d) LEED pattern after C deposition showing localized graphene diffraction spots. For reference, red circles highlight the same spots in (b). T = 870 °C, SV = 38.1 eV. (e) Intensity of the graphene LEED pattern extracted from (d) shows that the graphene is strongly localized to a single orientation. (f) LEED pattern after cooling to 90 °C, SV = 37.3 eV.

Figure 3

Figure 4. (a) Optical microscopy image of a graphene flake on SiO2 wafer after soaking a graphene-covered Ge(110) sample in water and collecting the flakes with the wafer. (b) Raman spectra taken at the three labeled locations in (a). The Raman peaks are consistent with defective graphene.

Figure 4

Figure 5. Top and side views of DFT optimized graphene on (a) Ge(111)c(2 × 8) and (b) Ge(110)c(8 × 10) structures and relevant geometric parameters. Carbon atoms are grey and Ge atoms are green. (c), (d) Top view of graphene corrugations on the Ge(111)c(2 × 8) surface (c) and the Ge(110)c(8 × 10) surface (d). The colored scale bar indicates the distance in the z-direction between the C atom and the plane of the Ge surface adatoms, i.e., the height difference.