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Diffusion-mediated chemical concentration variation and void evolution in ion-irradiated NiCoFeCr high-entropy alloy

Published online by Cambridge University Press:  29 October 2020

Zhe Fan*
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Weicheng Zhong
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Ke Jin
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Hongbin Bei
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Yuri N. Osetsky
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
Yanwen Zhang
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA
*
a)Address all correspondence to this author. e-mail: fanz@ornl.gov; zfan2@lamar.edu

Abstract

High-entropy alloys (HEAs) are proposed as potential structural materials for advanced nuclear systems, but little is known about the response of matrix chemistry in HEAs upon irradiation. Here, we reveal a substantial change of matrix chemical concentration as a function of irradiation damage (depth) in equiatomic NiCoFeCr HEA irradiated by 3 MeV Ni ions. After ion irradiation, the matrix contains more Fe/Cr in depth shallower than ~900–1000 nm but more Ni/Co from ~900–1000 nm to the end of the ion-damaged region due to the preferential diffusion of vacancies through Fe/Cr. Preferential diffusion also facilitates migration of vacancies from high radiation damage region to low radiation damage region, leading to no void formation below ~900–1000 nm and void formation around the end of the ion-damaged region at a fluence of 5 × 1016 cm−2 (~123 dpa, displacements per atom, peak dose under full cascade mode). As voids grow significantly at an increased fluence (8 × 1016 cm−2, 196 dpa), the matrix concentration does not change dramatically due to new voids formed below ~900–1000 nm.

Information

Type
Invited Feature Paper
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
Copyright © The Author(s), 2020, published on behalf of Materials Research Society by Cambridge University Press
Figure 0

Figure 1: Void distribution in NiCoFeCr irradiated at 580 °C to 5 × 1016 cm−2. (a) Dark-field STEM (scanning transmission electron microscopy) image with a zone axis of [110]. (b) SRIM-predicted damage production profile and injected Ni concentration. Beyond the dash-dot line, SRIM calculation predicts no damage.

Figure 1

Figure 2: Element segregation around defects in NiCoFeCr irradiated at 580 °C to 5 × 1016 cm−2. (a) Element segregation as a function of depth from the free surface. (b) Element segregation as a function of distance from a void center. (c) Comparison of maximum concentration variation of voids and surfaces with respect to the matrix.

Figure 2

Figure 3: Correlation between matrix concentration and defect distribution in NiCoFeCr irradiated at 580 °C to 5 × 1016 cm−2. (a) HAADF-STEM (high-angle annular dark-field) image with a zone axis of [110]. EDS line scans in the matrix are indicated by the arrows. (b) The evolution of matrix concentration with respect to depth. (c) The evolution of void swelling and dislocation density with respect to depth. The data in (c) are from Ref. [22].

Figure 3

Figure 4: Migration energy and diffusivity ratio among the constituent elements in NiCoFeCr. (a) Average migration energy of vacancy and interstitial calculated by density functional theory calculation [22, 32]. The average vacancy and interstitial migration energy for the matrix are indicated by the dashed and dash-dot line, respectively, and the migration energies for pure Ni were also indicated by the dotted lines. (b) The diffusivity ratio of interstitial over vacancy. The dotted line represents the diffusivity ratio of the matrix.

Figure 4

Figure 5: Transition from suppressed void formation to substantial void growth with increasing dose in NiCoFeCr irradiated at 500 °C. Bright-field TEM images (under-focused) of NiCoFeCr irradiated to (a) 5 × 1016 cm−2 and (b) 8 × 1016 cm−2. (c) Void swelling, SRIM-predicted damage production profile, and injected Ni concentration as a function of depth for NiCoFeCr irradiated to 8 × 1016 cm−2. Beyond the dash-dot line, SRIM calculation predicts no damage. The void swelling data in (c) are from Ref. [22].

Figure 5

Figure 6: Correlation between matrix concentration and void distribution in NiCoFeCr irradiated at 500 °C to 8 × 1016 cm−2. (a) HAADF-STEM image with a zone axis of [110]. EDS line scans in the matrix are indicated by the arrows. (b) The evolution of matrix concentration with respect to depth. (c) The evolution of void swelling with respect to depth (squares). For comparison, the void evolution in NiCoFeCr irradiated at 500 °C to 5 × 1016 cm−2 is also shown (circles). Note that the scales for two fluences are different. The void swelling data in (c) are from Ref. [22].

Figure 6

Figure 7: Void swelling with respect to dose in NiCoFeCr. (a) The evolution of void swelling in the ion-damaged region, non-damaged region, and overall swelling (including both ion-damaged and non-damaged regions) as a function of nominal peak dose and fluence. (b) The evolution of void swelling as a function of actual dose (circles). For comparison, the evolution of void swelling as a function of actual dose for Ni is also shown (squares).

Figure 7

Figure 8: Schematic of defect evolution and matrix concentration variation in ion-irradiated NiCoFeCr at elevated temperatures. (a) Production of interstitials and vacancies upon radiation. (b) Defect recombination and diffusion. (i) Enhanced interstitial-vacancy recombination in the peak damage region due to limited mobility of interstitials, (ii) preferential diffusion of vacancies outside of the peak damage region through Fe/Cr, and (iii) formation and growth of dislocations due to the accumulation of interstitials mainly in the peak damage region. (c) Microstructure at low doses. Due to preferential diffusion, dislocations dominate and no voids exist in the peak damage region where Fe/Cr is enriched and small voids form at the end of the ion-damaged region where Fe/Cr is depleted. (d) Microstructure at high doses. As the dislocations and matrix concentration evolve, voids are nucleated and grow substantially in the peak damage region. Details regarding the transition from suppressed void formation (c) to significant void swelling (d) can be found in Ref. [22].