Hostname: page-component-77f85d65b8-g98kq Total loading time: 0 Render date: 2026-03-29T21:54:59.399Z Has data issue: false hasContentIssue false

Behavioral modeling of RF power amplifiers using a time-domain characterization approach

Published online by Cambridge University Press:  04 April 2025

J. Ortali*
Affiliation:
XLIM – CNRS, 123 avenue Albert Thomas, Limoges, France
S. Mons
Affiliation:
XLIM – CNRS, 123 avenue Albert Thomas, Limoges, France
T. Reveyrand
Affiliation:
XLIM – CNRS, 123 avenue Albert Thomas, Limoges, France
E. Ngoya
Affiliation:
XLIM – CNRS, 123 avenue Albert Thomas, Limoges, France
C. Mazière
Affiliation:
AMCAD ENGINEERING, 20 rue d’Atlantis, Limoges, France
*
Corresponding author: J. Ortali; Email: jean.ortali@xlim.fr

Abstract

In this article, we discuss the behavioral modeling of the power amplifier (PA) for system-level simulations through its most advanced approach, named TPM model, based on a simplification of the Volterra series following the method of separation of the low and high frequency memory effects present in PA. The model, relying on frequency domain CW characterization of the PA, shows a limitation when applied to high-power radar applications, for which this article investigates an alternate solution based on time-domain pulsed RF characterization.

Information

Type
Research Paper
Copyright
© The Author(s), 2025. Published by Cambridge University Press in association with The European Microwave Association.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable