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Temporal characterization of ultrashort pulses via reflected four-wave mixing with perturbation on a solid surface

Published online by Cambridge University Press:  19 December 2024

Jinhui Li
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
Keyang Liu*
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Hao Yuan
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
Xingguo Wang
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Qiwen Zhen
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
Xianglin Wang
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China
Yishan Wang
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
Wei Zhao
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
Huabao Cao*
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
Yuxi Fu*
Affiliation:
Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China State Key Laboratory of Ultrafast Optical Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an, China University of Chinese Academy of Sciences, Beijing, China
*
Correspondence to: K. Liu, H. Cao, and Y. Fu, Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China. Emails: liukeyang@opt.ac.cn (K. Liu); caohuabao@opt.ac.cn (H. Cao); fuyuxi@opt.ac.cn (Y. Fu)
Correspondence to: K. Liu, H. Cao, and Y. Fu, Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China. Emails: liukeyang@opt.ac.cn (K. Liu); caohuabao@opt.ac.cn (H. Cao); fuyuxi@opt.ac.cn (Y. Fu)
Correspondence to: K. Liu, H. Cao, and Y. Fu, Center for Attosecond Science and Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China. Emails: liukeyang@opt.ac.cn (K. Liu); caohuabao@opt.ac.cn (H. Cao); fuyuxi@opt.ac.cn (Y. Fu)

Abstract

Time-domain characterization of ultrashort pulses is essential for studying interactions between light and matter. Here, we propose and demonstrate an all-optical pulse sampling technique based on reflected four-wave mixing with perturbation on a solid surface. In this method, a weak perturbation pulse perturbs the four-wave mixing signal generated by a strong fundamental pulse. The modulation signal of the four-wave mixing, which is detected in the reflection geometry to ensure a perfect phase-matching condition, directly reflects the temporal profile of the perturbation pulse. We successfully characterized multi-cycle and few-cycle pulses using this method. The reliability of our approach was verified by comparing it to the widely employed frequency-resolved optical gating method. This technique provides a simple and robust method for characterizing ultrashort laser pulses.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2024. Published by Cambridge University Press in association with Chinese Laser Press
Figure 0

Figure 1 (a) Spectra (solid lines) and spectral phases (dash-dot lines) of ${E_\mathrm{f}^5}\left({t}\right)$ with different dispersions: GDD = 200 fs2 (red) and GDD = 300 fs2 (blue). For comparison, the spectral phases (dash lines) of ${E}_{\mathrm{f}}\left({t}\right)$ were also plotted for GDD = 200 fs2 (red) and 300 fs2 (blue). The black and green solid lines correspond to the spectra of ${E}_{\mathrm{f}}\left({t}\right)$ and ${E_\mathrm{f}^5}\left({t}\right)$ without chirp. (b) Measured pulse duration before (blue) and after (green) correction of spectrum for different GDD.

Figure 1

Figure 2 (a) Wave-vectors of the first three terms of Equation (5). (b) RFWM with perturbation on the surface of a solid plate. The red and light red beams represent the fundamental pulse and perturbation pulse, respectively. The three beams generated by four-wave mixing have larger divergence angles, which are green, yellow and purple corresponding to the first three terms on the right-hand side of Equation (5). The incident angle between fundamental and perturbation pulses is exaggerated for clarity.

Figure 2

Figure 3 Schematic of the experimental setup. Mask1 is used to split the input pulse into the fundamental pulse and the perturbation pulse. The two pulses are focused by a concave mirror onto the fused silica surface to generate the RFWM signal. The angle between the fundamental and perturbation pulses is exaggerated for clarity. The relative delay between the two pulses is controlled by the D-shape mirror. The RFWM signal is coupled into the detector by a lens after passing through mask2.

Figure 3

Figure 4 (a) Evolution of the RFWM signal measured by a spectrometer with different relative delays between the fundamental and perturbation pulses. (b) Modulation signal of the RFWM obtained by integrating (a) along the wavelength axis.

Figure 4

Figure 5 Temporal sampling of 800 nm pulses by RFWM with perturbation. (a), (c), (e) Measured RFWM modulation signal and the envelope of chirp-free, positively chirped and negatively chirped pulses, respectively. (b), (d), (f) Comparison of the spectra and spectral phases retrieved by this method and TG-FROG. The black solid lines illustrate the spectra measured by the spectrometer.

Figure 5

Figure 6 Temporal sampling of pulses at 1700 nm by RFWM with perturbation. (a), (c), (e) Measured RFWM modulation signal and the envelope of chirp-free, positively chirped and negatively chirped pulses, respectively. (b), (d), (f) Comparison of the spectra and spectral phases retrieved by the RFWM with perturbation method and SHG-FROG. The black solid lines illustrate the spectra measured by the spectrometer.

Figure 6

Figure 7 Measurement results of the 800 nm few-cycle pulse by RFWM with perturbation. (a) Modulation signal (blue solid line) and envelope (red solid line) of the few-cycle pulse. The envelope of the TL pulse is shown by the black solid line. (b) Retrieved spectrum (blue solid line) and spectral phase (red solid line). The orange solid line illustrates the spectrum measured by the spectrometer.