Hostname: page-component-77f85d65b8-8wtlm Total loading time: 0 Render date: 2026-03-28T13:13:06.038Z Has data issue: false hasContentIssue false

Surface characterization of ICF capsule byAFM-based profilometer

Published online by Cambridge University Press:  18 September 2017

Jie Meng
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Xuesen Zhao
Affiliation:
P.O.Box 413, Harbin Institute of Technology, Harbin 150001, PR China
Xing Tang
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Yihao Xia
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Xiaojun Ma
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Dangzhong Gao*
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
*
Correspondence to: D. Gao, Research Center of Laser Fusion, CAEP, No. 64 Mianshan Road, Mianyang 621000, China. Email: dgaocn@163.com

Abstract

Outside surface fluctuations of inertial confinement fusion (ICF) capsule greatly affect the implosion performance. An atomic force microscope (AFM)-based profilometer is developed to precisely characterize the capsule surface with nanometer resolution. With the standard nine surface profiles and the complete coverage data, 1D and 2D power spectra are obtained to quantitatively qualify the capsule. Capsule center fast aligning, orbit traces automatic recording, 3D capsule orientation have been studied to improve the accuracy and efficiency of the profilometer.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
© The Author(s) 2017
Figure 0

Figure 1. Schematic of capsule profilometer setup.

Figure 1

Figure 2. Photo of capsule profilometer.

Figure 2

Figure 3. CCD video shots during measurement.

Figure 3

Figure 4. The process steps of capsule center alignment.

Figure 4

Figure 5. AFM tip and capsule.

Figure 5

Figure 6. Measured surface traces in one orbit.

Figure 6

Figure 7. Trace patterns for capsule measurement.

Figure 7

Figure 8. Traces (a) before and (b) after capsule repositioning of $360^{\circ }$.

Figure 8

Figure 9. Noise power spectra.

Figure 9

Figure 10. Orbits covering the complete surface.

Figure 10

Figure 11. Surface reconstruction with different orders.

Figure 11

Figure 12. (a) Surface profile traces and (b) corresponding 1D mode-power spectrum.

Figure 12

Figure 13. 2D power spectrum curve.

Figure 13

Figure 14. Power spectrum curves with (a) good surface quality and (b) bad surface quality.