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Microstructure and mechanical properties of electrodeposited Al1−x Mnx /Al1−y Mny nanostructured multilayers

Published online by Cambridge University Press:  26 September 2014

Wenjun Cai*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA; and Department of Mechanical Engineering, University of South Florida, Tampa, Florida 33620, USA
Christopher A. Schuh
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
*
a) Address all correspondence to this author. e-mail: caiw@usf.edu

Abstract

Nanostructured Al1−x Mnx /Al1−y Mny multilayers were deposited from room temperature ionic liquid using galvanostatic control at various current densities and electrolyte compositions. By tuning the deposition parameters, multilayers with both micrometer and nanometer layer thicknesses were synthesized, with modulation of the elastic modulus and hardness between Mn-lean and Mn-rich layers. Surface morphology, composition, and microstructure of the films were characterized using x-ray diffraction and electron microanalysis tools. Nanoindentation and nanoscratch tests were performed to evaluate the mechanical and tribological properties of selected multilayers. Finally, the effects of deposition parameters on the microstructure evolution and mechanical properties of the multilayers were discussed.

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Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. Mn concentration in monolithic Al–Mn alloy deposits as a function of (a) MnCl2 concentration in the electrolyte, and (b) deposition current density.

Figure 1

FIG. 2. (a) Cross-sectional SEM image of Al–Mn microlayered film. Overlaid profiles in (a) are the Al and Mn concentration. (b) Friction coefficient and wear track depth profile measured from nanoscratch test on the cross-sectioned sample in (a).

Figure 2

TABLE I. Summary of layer thickness, composition, and mechanical properties of Al–Mn microlayered films.

Figure 3

FIG. 3. (a)-(i) Cross-sectional SEM images of nine Al-Mn nanolaminates (sample ID 1 to 9) electrodeposited using alternating current between 10 and 4 mA/cm2 for a total of 2 hrs. The insets show corresponding SEM images of the sample surfaces. All cross-sectioned samples are prepared by FIB with a protective Pt layer. Arrows indicate the thickness of two layers, or one wavelength.

Figure 4

TABLE II. Summary of composition, microstructure, and mechanical properties of nine Al–Mn nanolaminates. Mn concentrations of each layer are measured by EDX inside a TEM.

Figure 5

FIG. 4. XRD line scan of nine Al–Mn nanolaminates.

Figure 6

FIG. 5. (a) Bright-field TEM image and (b) HAADF image of sample 1. (c) EDS line scan along arrow direction in (b).

Figure 7

FIG. 6. (a, c, e) Bright field and (b, d, f) dark field cross-sectional TEM images of samples 4–6. Insets in (b, d, f) show the corresponding SAD patterns from multiple Mn-lean and Mn-rich layers.

Figure 8

FIG. 7. Grain size distribution of Mn-rich (A) and Mn-lean (B) layers for samples (a) 4, (b) 5, and (c) 6.

Figure 9

FIG. 8. (a) Bright-field TEM image, and high-resolution TEM images of (b) layer A and (c) layer B of sample 7. Top left inset in (a) shows selected-area diffraction patterns from layers A and B. Top right inset in (a) shows the intensity profile along the arrows noted in the diffraction patterns.

Figure 10

FIG. 9. High-resolution TEM image of sample 7 demonstrating icosahedral phase formation. The top left inset is a fast Fourier transformation (FFT) taken from the whole image, revealing a symmetry with fifteen 2-fold axes, similar to the diffraction pattern along a 2-fold axis taken by Shechtman et al. PRL, 1984 (top central inset). An inverse fast Fourier transformation (IFFT) is calculated from the box area and shown in the lower right, along with a schematic image constructed from intersections of three icosahedra with the D3h symmetry.

Figure 11

FIG. 10. Hardness as a function of layer thickness for samples 1–9.