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Optical diagnostics for density measurement in high-quality laser-plasma electron accelerators

Published online by Cambridge University Press:  26 April 2019

Fernando Brandi*
Affiliation:
Intense Laser Irradiation Laboratory (ILIL), Istituto Nazionale di Ottica – Consiglio Nazionale delle Ricerche (INO-CNR), Sede Secondaria di Pisa, Via Moruzzi, 1, 56124 Pisa, Italy
Leonida Antonio Gizzi
Affiliation:
Intense Laser Irradiation Laboratory (ILIL), Istituto Nazionale di Ottica – Consiglio Nazionale delle Ricerche (INO-CNR), Sede Secondaria di Pisa, Via Moruzzi, 1, 56124 Pisa, Italy Istituto Nazionale di Fisica Nucleare (INFN), Sezione di Pisa, Largo Bruno Pontecorvo, 3, 56127 Pisa, Italy
*
Correspondence to: F. Brandi, Istituto Nazionale di Ottica – Consiglio Nazionale delle Ricerche (INO-CNR), Sede Secondaria di Pisa, Via Moruzzi, 1, 56124 Pisa, Italy. Email: fernando.brandi@ino.cnr.it

Abstract

Implementation of laser-plasma-based acceleration stages in user-oriented facilities requires the definition and deployment of appropriate diagnostic methodologies to monitor and control the acceleration process. An overview is given here of optical diagnostics for density measurement in laser-plasma acceleration stages, with emphasis on well-established and easily implemented approaches. Diagnostics for both neutral gas and free-electron number density are considered, highlighting real-time measurement capabilities. Optical interferometry, in its various configurations, from standard two-arm to more advanced common-path designs, is discussed, along with spectroscopic techniques such as Stark broadening and Raman scattering. A critical analysis of the diagnostics presented is given concerning their implementation in laser-plasma acceleration stages for the production of high-quality GeV electron bunches.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
© The Author(s) 2019
Figure 0

Figure 1. Upper panel: interferogram of a pulsed gas jet in vacuum with a rectangular orifice acquired by means of a Nomarski interferometer; lower panel: corresponding average density map obtained with a phase-retrieval algorithm[22].

Figure 1

Figure 2. Schematic representation of the most common interferometers used for density measurements in laser-plasma accelerators; M, mirror; BS, beam splitter; SHG, second-harmonic generation unit. Optical elements used for imaging, such as lenses, are omitted for clarity.

Figure 2

Figure 3. Real-time measurements of the Ar gas number density inside a pulsed gas flow cell by an SHI at 1064 nm: black curve, pulse length 100 ms; red curve, pulse length 500 ms. Backing Ar pressure 600 mbar.

Figure 3

Table 1. Expected phase shifts in TAIs and SHIs for both hydrogen gas and free electrons at 800 nm and 400 nm wavelengths, with $L$ expressed in cm, $n_{g}$ in $10^{19}~\text{cm}^{-3}$ and $n_{e}$ in $10^{17}~\text{cm}^{-3}$. Note that for SHI the fundamental wavelength used is indicated, while the phase is actually measured at its second harmonic, i.e., 400 nm.

Figure 4

Figure 4. Interferometric capability for neutral hydrogen density measurements. For each methodology considered, the wavelength used and the measured phase are shown. For SHI, the fundamental wavelength used is reported, while the phase shift refers to the actually detected second-harmonic wavelength, i.e., 400 nm. The solid lines correspond to the smallest measurable phase, indicated in the legend, while the dashed lines correspond to measurements within half-fringe.

Figure 5

Figure 5. Interferometric capability for free-electron density measurements. For each methodology considered the wavelength used and the measured phase are shown. For SHI, the fundamental wavelength used is reported, while the phase shift refers to the actually detected second-harmonic wavelength, i.e., 400 nm. The solid lines correspond to the smallest measurable phase, indicated in the legend, while the dashed lines correspond to measurements within half-fringe, except for group delay measurements with the SHI.

Figure 6

Figure 6. Schematic of the Stark broadening measurement setup, showing both longitudinal and transverse configurations.

Figure 7

Table 2. Qualitative comparison of interferometric methods.

Figure 8

Figure 7. Schematic of the Raman scattering measurement setup, showing both backward and forward configurations. M, mirror, Mh, mirror with a hole in the center to let the electron beam through.