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Strongly scale-dependent charge transport from interconnections of silicon quantum dots and nanowires

Published online by Cambridge University Press:  07 September 2017

Serim Ilday*
Affiliation:
Department of Physics, Bilkent University, Ankara 06800, Turkey
*
Address all correspondence to Serim Ilday at serim@bilkent.edu.tr

Abstract

We present the first characterization of strongly scale-dependent charge transport of a unique, hierarchical complex topology: an interconnected random network of silicon quantum dots (QDs) and nanowires. We show that this specific topology has different charge transport characteristics on the nanoscale and the microscale: photogenerated charge carriers tend to be confined inside the QDs and externally injected charge carriers flow preferably along the nanowires. The former enables expression of quantum confinement properties, and the latter mainly contributes to the good electrical conduction on the microscale. Our findings strongly suggest that this multifunctionality can be controlled and used in photovoltaic device applications.

Information

Type
Research Letters
Copyright
Copyright © Materials Research Society 2017 
Figure 0

Figure 1. (a) Two-dimensional (2D) projections of 3D APT images of the random network structure. (b) Superposition of the Si (bright) and the SiOx (dark) plasmon EFTEM images showing percolated Si QD network inside a SiOx matrix.

Figure 1

Figure 2. Graphs show I–V measurements under light-illuminated and dark conditions for the (a) lateral and (b) vertical directions.

Figure 2

Figure 3. (a) APT image shows undulated and branching wire-like morphology of the random network, where the wire diameters differentiate spatially. The externally connected Si QD cluster is colored pink and internally connected, but externally isolated clusters are colored gray (circled in red dashed lines). Graph showing non-linear I–V curve and a voltage gap at low bias voltages for the random network structure indicating a possible Coulomb charging effect that is absent for post-network structure for the (b) lateral and (c) vertical directions.

Figure 3

Figure 4. Graph showing PL and EL response of the random network structure.

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